RASDAT`10

IEEE International Workshop on Reliability Aware System Design and Test

(In conjunction with the International Conference on VLSI Design)

Bangalore, India January 7-8, 2010

 

 

Organizing Committee

 

General Co-Chairs

Adit Singh (Auburn Univ., USA)

Virendra Singh (IISc, India)

General Vice Co-Chairs

Michiko Inoue (NAIST, Japan)

Sreejit Chakravarty (LSI, USA)

Program Co-Chairs

Erik Larsson (Linkoping Univ., Sweden)

Rubin Parekhji (Texas Instruments, India)

Program Vice Co-Chairs

Ilia Polian (Freiburg Univ., Germany)

MS Gaur (MNIT, India)

Organizing Committee Co-Chairs

Bhargab Bhattacharya (ISI, India)

SK Nandy (IISc, India)

Publication Chair

V. Kamakoti (IIT Madras, India)

Finance Chair

Pradip Thaker (Analog Devices, India)

Publicity Chair:

Susanta Chakravarty (BESU, India)

Local Arrangement chair

Suraj Sindia (Analog Devices, India)

Viney Kumar (nVidia, India)

Website management chair

Sushil Kabra (BSNL, India)

Registration Chair

Jaynarayan Tudu (IISc, India)

 

Steering Committee:

 

Kewal K. Saluja (Univ. of Wisconsin-Madison, USA) - Chair

 

Jacob A. Abraham (Univ. of Texas, Austin, USA)

Vishwani .D. Agrawal (Auburn University, US)

Bashir Al-Hashimi (Suthampton Univ., UK)

B. Becker (Freiburg Univ., Germany)

Abhijit Chatterjee (Georgia Tech, USA)

Hideo Fujiwara (NAIST, Japan)

Masahiro Fujita (Tokyo Univ., Japan)

Erik Larsson (Linkoping Univ., Sweden)

Rubin Parekhji (Texas Instruments, India)

Sudhakar M. Reddy (Iowa Univ., USA)

Adit D. Singh (Auburn Univ., USA)

Virendra Singh (IISc, India)

 

 

Program Committee

 

M. Azimane, NXP Semiconductors, The Netherlands
B. Bhattacharya, ISI, India
P. Bernardi, Politecnico di Torino, Italy
K. Chakrabarty, Duke University, USA
K.T. Cheng, University of California, Santa Barbara, USA

G. Di Natale, LIRMM, France
E. Fernandes Cota, Universidade Federal do Rio Grande do Sul, Brasil
P. Harrod, ARM, United Kingdom
U. Ingelsson, Linkoping University, Sweden
G. Jervan, Tallinn University of Technnology, Estonia
P. Girard, LIRMM, France
S. K. Goel, USA
V. Hahanov, Kharkov National University of Radioelectronics, Ukraine
K. Hatayama, Semiconductor Technology Academic Research Center, Japan
S. Hellebrand, Universität Paderborn, Germany
T. Inoue, Hiroshima University, Japan
V. Kamakoti, IIT Madras, India
S. Kajihara, Kyushu Institute of Technology, Japan
R. Kapur, Synopsys, USA
H. Ko,McMaster University, Canada
S. Kundu,University of Massachusetts Amherst,USA
S. Kumar, University of Jonkoping, Sweden

V. Laxmi (Malaviya national Institute of Technology, India)
Y. Makris, Yale University, USA
E. Marinissen, IMEC, Belgium
S. Mitra, Standford University, USA
C. Metra, University of Bologna, Italy

Z. Navabi, Tehran University, Iran
N. Nicolici, McMaster University, Canada

C.Y. Ooi, Malaysia Technology University, Malaysia
A. Osseiran, Edith Cowan University, Australia
S. Othake, Nara Institute of Science and Technology, Japan
J. Raik, Tallinn University of Technnology, Estonia
S. Ravi, Texas Instruments, India
M. Renovell, LIRMM, France
B. Rouzeyre, LIRMM, France
M. Sonza Reorda, Politecnico di Torino, Italy
N. Tamrapalli, AMD, India

P. Thaker, Analog Devices, India
P. Varma, Bluepearlsoftware, USA

V. Vedula, Intel, India
B. Vermeulen, NXP Semiconductors, The Netherlands
M. Violante, Politecnico di Torino, Italy
H.-J. Wunderlich, Universitat Stuttgart, Germany
Q. Xu, The Chinese University of Hong Kong, China
T. Yoneda, Nara Institute of Science and Technology, Japan

Z. You, Hunan University, China

M. Zwolinki, University of Southampton, United Kingdom