3rd IEEE International Workshop on
Reliability Aware System Design and Test (In
conjunction with the International
Conference on VLSI Design) |
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Past Events Key Dates Invited Talks Panel Visa Next |
Even as advances in CMOS technology come up
against physical limits of material properties and lithography, raising many
new challenges that must be overcome to ensure IC quality and reliability,
there appears to be no obvious alternate technology that can replace
End-of-Roadmap CMOS over the next decade. However, many reliability
challenges from increasing defect rates, manufacturing variations, soft
errors, wearout, etc. will need to be addressed by
innovative new design and test methodologies if device scaling is to continue
on track as per Moore`s Law to 10nm and beyond. The
key objective of this annual workshop, planned to be held in conjunction with
the International Conference on VLSI Design, is to provide an informal forum
for vigorous creative discussion and debate of this area. The aim is to
encourage the presentation and discussion of truly innovative and `out-of-the-box` ideas that may not yet have been
fully developed for presentation at reviewed conferences to address these
challenges. Additionally, the workshop invites embedded talks and tutorials
on cutting edge topics related to reliability aware design of CMOS and hybrid
nanotechnology systems. Representative topics include, but are not limited to:
Submissions Authors
are invited to submit previously unpublished technical proposals. The proposals
must be full papers not to exceed 6 pages. Each submission should include:
title, full name and affiliation of all authors, a short abstract of 50
words, and 4 to 6 keywords. Also, identify a contact author and include
a complete correspondence address, phone number, fax number, and e-mail
address. Submit a copy of your proposal in PDF either online
submission or via e-mail to : rasdat2012@serc.iisc.ernet.in Key Dates: Paper
Submission: October
21, 2011 Acceptance
Notification: November 15, 2011 Final
Paper Due: December 15, 2011 Presentation
Due: Jan 1, 2012 General Information
Program Related Information
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Organizing Committee General Co-Chairs Adit
Singh ( Virendra Singh ( General Vice Co-Chairs Michiko
Inoue (NAIST, JP) Sreejit Chakravarty ( Program Co-Chairs Erik
Larsson ( Rubin
Parekhji (TI, IN) Program Vice
Co-Chairs Ilia Polian ( MS Gaur (MNIT, IN) Organizing Committee Co-Chairs Bhargab
Bhattacharya (ISI, IN) V. Kamakoti (IITM, IN) Publication Chair Vijay Laxmi
(MNIT, IN) Finance Co-Chairs Pradip Thaker ( S. Ramakrishnan
(WT, IN) Publicity Co-Chairs Susanta Chakravarty (BESU, IN) Chia Yee Ooi
(UTM, MY) Local Arrangement chair TBD Website management chair Sushil
Kabra (BSNL, IN) Registration Chair Jaynarayan Tudu ( Steering
Committee Kewal K. Saluja (US) -
Chair Jacob A. Abraham (US) Vishwani
D. Agrawal (US) Bashir Al-Hashimi (UK) Bernd Becker (DE) Abhijit Chatterjee (US) Hideo Fujiwara (JP) Masahiro Fujita (JP) Erik Larsson (SE) Rubin Parekhji
(IN) Sudhakar M. Reddy (US) Adit D.
Singh (US) Virendra Singh (IN) Program
Committee M. Azimane
(NL) P. Bernardi
(IT) B. Bhattacharya (IN) K. Chakrabarty
(US) S. Chakravarty
(IN) T. Cheng (US) E.F. Cota
(BR) D. Das (IN) G. Di Natale
(FR) P. Girard (FR) S.K. Goel
(US) P. Harrod
( K. Hatayama (JP) V. Hahanov
(UA) S.
Hellebrand (DE) U. Ingelsson (SE) M. Inoue (JP) T. Inoue (JP) G. Jervan
(ES) S.
Kajihara (JP) V.
Kamakoti (IN) R. Kapur
(US) H. Ko
(CA) S. Kumar
(SE) S. Kundu
(US) V. Laxmi
(IN) Y. Makris (US) A. Matrosova (RU) C. Metra (IT) S. Mitra
(US) S.K. Nandy
(IN) Z. Navabi
(IR) N. Nicolici
(CA) S. Ohtake
(JP) C.Y. Ooi
(MY) A. Osseiran (AU) J. Raik (EE) S. Ravi
(IN) CP
Ravikumar (IN) M. Renovel
(FR) B.
Rouzeyre (FR) M. Sonza
Reorda (IT) N.
Tamrapalli (IN) P. Thaker (IN) P. Varma (US) V. Vedula (IN) B. Vermeulen (NL) M. Violante (IT) H. -J. Wunderlich (DE) Q. Xu (CN) T. Yoneda
(JP) Z. You (CN) M. Zwolinski (UK) |