4th IEEE International
Workshop on Reliability Aware System Design and Test
(In conjunction with the International Conference on VLSI
Design)
Pune, India January 9-10, 2013
Technical Program
Day 1 (Jan
9)
5:30 pm -- 5:40 pm |
Inauguration and Opening Remarks |
5:40 pm -- 6:20 pm |
Keynote 1 Speaker: Prof. Raimund
Ubar |
6:20 pm -- 7:00 pm |
Invited Talk 1 Speaker: Prof. Seiji Kajihara |
Day 2 (Jan 10)
9:00 am -- 9:40 am |
Keynote 2 Speaker: Prof. Jacob Abraham |
9:40 am -- 10:15 am |
Invited Talk 2 Speaker: Prof. Masahiro Fujita |
10:15 am -- 11:45 am |
Coffee Break |
11:45 am -- 12:45 pm |
Session 1 Fault tolerance Session Chair: Prof. Raimund
Ubar |
12:45 pm -- 1:45 pm |
Lunch Break |
1:45 pm -- 2:30 pm |
Embedded Tutorial Speaker: Prof. Adit
Singh |
2:15 pm – 3:15 pm |
Session 2 Reliability of Issues Session Chair: Prof. Kewal
Saluja |
3:15 pm -- 3:45 pm |
Coffee Break |
3:45 pm -- 4:45 pm |
Session 3 Reconfigurable Design Session Chair: Prof. M.S. Gaur |
4:45 pm -- 5:00 pm |
Closing |
Session 1: (Fault Tolerance)
S1.1 Fault tolerant XY routing in NoC using LBDR
Rimpy, Manoj Kumar, Vijay Laxmi,
and M.S. Gaur (MNIT, Jaipur)
S1.2 An
availability model for planning self test and repair processes for fault
tolerant
FPGA-based systems
Shampa Chakravarty, Anubhav
Agrawal, Broteen Kundu (NSIT, Delhi)
S1.3 A design for testability technique of
reversible circuits using duplication techniques
Joytee Mondal, Debesh
K Das (Jadavpur Univ.), Deepak Kole,
and Hafizur Rahman (BESU,
Kolkata)
Session 2: (Reliability of Issues)
S2.1
A weakely fault tolerant design of molecular
memory cell
Renu Kumawat, Vineet
Sahula, and M.S. Gaur (MNIT, Jaipur)
S2.2 CNT Interconnect Performance
Optimization and
Comparison with
Copper at 22nm Technology
Kureshi A.K
(Vishwabharati college of Engg,
Ahmed Nagar), Mohd. Hasan
(AMU, Aligarh)
S2.3: Timing
driven variation aware uniform geometry Steiner tree construction
Radhamanjari Samanta, Somyendu Raha (IISc, Bangalore), Edil Erzin (Russian Academiy of Sciences, Novosibirsk)
Session 3: (Reconfigurabel
design)
S3.1
A
Novel Application-aware Parallel and Reconfigurable fault-tolerant self-healing
System
Deepa Jose, Nirmal Kumar, Jaykumar P (College of Engineering, Guindy)
S3.2 Design of self-reconfigurable adder for fault tolerant VLSI
architectures
Atin Mukherjee and A.S. Dhar
(IIT Kharagpur)
S3.3 Low activity scan FF design for power
aware test
Ashok Suhag (GB Univ., Noida) , Satdev Ahlawat
(KU, Kurukshetra), Jaynarayan
(IISc, Bangalore)
S3.4 Peak power estimation for power grid design (Invited paper)
Jaynarayan Tudu (IISc, Bangalore), Deepak Malani,
and Virendra Singh (IIT Bombay)