V. Ramgopal Rao, Ph.D., FNAE, FASc, FNASc

Institute Chair Professor, Department of Electrical Engineering

IIT Bombay

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LIST OF PUBLICATIONS

INTERNATIONAL JOURNALS /INTERNATIONAL CONFERENCE PROCEEDINGS

Publications in IEEE Transactions / IEEE Equivalent Journals: >100

(mainly in IEEE Transactions on Electron Devices & IEEE Electron Device Letters)

Publications in the International Electron Devices Meeting (IEDM) & the International Reliability Physics Symposium (IRPS) (the two most prestigious conferences for Electron Devices): 12

(Journal papers are listed first followed by the conference papers)

  1. K. Prashanthi, M. Naresh, V. Seena, T. Thundat, V. Ramgopal Rao, "A Novel Photo-Plastic Piezoelectric Nanocomposite for MEMS Applications", Accepted for publication in (IEEE/ASME) Journal of Microelectromechanical Systems (J-MEMS), 2011


  2. Mrunal A. Khaderbad, Y. Choi, P. V. Hiralal, A. Aziz, N. Wang, C. Durkan, P. Thiruvenkatanathan, G. A. J. Amaratunga, V. Ramgopal Rao and A. A. Seshia, " **Electrical Actuation and Readout in a Nanoelectromechanical Resonator based on a Laterally Suspended** Zinc Oxide Nanowire** " Accepted for publication, IOP Nanotechnology, 2011*


  3. V. Seena, A. Nigam, P. Pant, S. Mukherji and V. Ramgopal Rao, "Organic CantiFET: A Nanomechanical Polymer Cantilever Sensor with an Integrated OFET", Accepted for publication in IEEE/ASME Journal of Microelectromechanical Systems (J-MEMS), 2011


  4. Neena A. Gilda, Sudip Nag, Sheetal Patil, M. Shojaei Baghini, D. K. Sharma, V. Ramgopal Rao, "Current Excitation Method for ΔR Measurement in Piezo-Resistive Sensors with a 0.3 ppm Resolution", Accepted for publication in IEEE Transactions on Instrumentation & Measurement, 2011


  5. Ramesh R. Navan, Bharati Panigrahy, M. Shojaei Baghini, D. Bahadur, V. Ramgopal Rao, "Mobility enhancement of solution-processed Poly(3-Hexylthiophene) based organic transistor using zinc oxide nanostructures", Composites: Part B (2011), DOI: 10.1016/j.compositesb.2011.08.007 (Elsevier)


  6. V Seena, A. Fernandes, Prita Pant, S. Mukherji, V. Ramgopal Rao,"Polymer nanocomposite nanomechanical cantilever sensors: materialcharacterization, device development and application in explosive vapour detection," IOP Nanotechnology 22 (2011) 295501 (11pp) DOI: http://dx.doi.org/10.1088/0957-4484/22/29/295501


  7. V. Seena, Avil Fernandes, Soumyo Mukherji and V. Ramgopal Rao, "Photoplastic Microcantilever Sensor Platform for Explosive Vapor Detection", To appear in International Journal of Nanoscience 2011.


  8. V. Seena, Ravishankar S. Dudhe, Harshil N. Raval, Sheetal Patil, Anil Kumar, Soumyo Mukherji and V. Ramgopal Rao, "Organic Sensor Platforms for Environmental and Security Applications", Electro-Chemical-Society (ECS) Transactions, Vol. 35, 67 (2011), DOI:10.1149/1.3569900


  9. Rajesh A. Thakker, Mayank Srivastava, Ketankumar H. Tailor, Maryam Shojaei Baghini, Dinesh K. Sharma, V. Ramgopal Rao and Mahesh B. Patil, "A Novel Architecture for Improving Slew Rate in FinFET-based Op-Amps and OTAs", Microelectronics Journal, Volume 42, Issue 5, May 2011, Pages 758-765, DOI:10.1016/j.mejo.2011.01.010 (Elsevier)


  10. Rajashree Rajagopal, S. N. Kale, N. A. Raorane, R. Pinto and V. Ramgopal Rao, "Fabrication of La0.7Sr0.3MnO3 (LSMO)- Si Heterojunctions Using a CMOS Compatible Citric Acid Etch Process", IEEE Electron Device Letters, Vol. 32, No. 3, March 2011


  11. Ram Asra, Mayank Shrivastava, K. V. R. M. Murali, R. K. Pandey, Harald Gossner and V. Ramgopal Rao, "Tunnel FET for VDD Scaling Below 0.6V with CMOS Comparable Performance", IEEE Transactions on Electron Devices, Vol. 58, No. 7, July 2011


  12. Mayank Shrivastava, Ruchit Mehta, Shashank Gupta, Nidhi Agrawal, M. Shojaei Baghini, D. K. Sharma, Thomas Schulz, Klaus Arnim, Wolfgang Molzer, Harald Gossner and V. Ramgopal Rao, "Towards System on Chip (SoC) Development Using FinFET Technology: Challenges, Solutions, Process Co-Development & Optimization Guidelines", IEEE Transactions on Electron Devices, Vol. 58, No. 6, June 2011


  13. Ravishankar S. Dudhe, Jasmine Sinha, D. S. Sutar, Anil Kumar and V. Ramgopal Rao, "Poly 3-hexylthiophene and hexafluoro-2-propanol-substituted polysiloxane based OFETs as a sensor for explosive vapour detection", Sensors and Actuators A: Physical (Elsevier), Vol. 171 (2011) pages: 12-18


  14. Manoj Joshi, Prasanna Gandhi, Rakesh Lal, V. Ramgopal Rao and Soumyo Mukherji, "Modeling, Simulation and Design Guidelines of Piezoresistive Affinity Cantilever", IEEE/ASME Journal of Microelectromechanical Systems, Vol. 20, No. 3, June 2011


  15. Mayank Shrivastava, Ruchil Jain, M. S. Baghini, Harald Gossner and V. Ramgopal Rao, "A Solution towards the OFF State Degradation in Drain extended MOS Devices", IEEE Transactions on Electron Devices, Vol. 57, No. 12, December 2010


  16. Manoj Joshi, V. Ramgopal Rao and Soumyo Mukherji, "A novel technique for microfabrication of ultra thin affinity cantilevers for characterization with an AFM", Institute of Physics Publishing, Journal of Micromechanics and Microengineering, vol. 20 (2010) 125007.


  17. Ram Asra, Kota V. Murali and V. Ramgopal Rao, "A Binary Tunnel Field Effect Transistor with a Steep Sub-threshold Swing and Increased ON Current", Japanese Journal of Applied Physics, 49 (2010) 120203


  18. H. N. Raval and V. Ramgopal Rao, "Low Operating Voltage Operation and Improvement in Sensitivity with Passivated OFET Sensors for Determining Total Dose Radiation", IEEE Electron Device Letters, Vol. 31, No.12, December 2010


  19. H. S. Tan, B. C. Wang, S. Kamath, J. Chua, Maryam Shojaei Baghini, V. Ramgopal Rao, N. Mathews and S. G. Mhaisalkar, "Complementary Organic Circuits using Evaporated F16CuPc and Inkjet Printing of PQT", IEEE Electron Device Letters, Vol. 31, No.11, November 2010


  20. Ashish Pal, Angada B. Sachid, Harald Gossner and V. Ramgopal Rao, "Insights into the Design and Optimization of Tunnel-FET Devices and Circuits", IEEE Transactions on Electron devices, VOL. 58, No. 4, p. 1045, April 2011


  21. Mayank Shrivastava, H. Gossner, M. S. Baghini and V. Ramgopal Rao, "Part I: On the Behavior of STI Type DeNMOS Device Under ESD Conditions", IEEE Transactions on Electron Devices, Vol. 57, No. 9, September 2010


  22. Mayank Shrivastava, H. Gossner, M. S. Baghini and V. Ramgopal Rao, "Part II: On the 3D Filamentation and Failure Modeling of STI Type DENMOS Device Under Various ESD Conditions", IEEE Transactions on Electron Devices, Vol. 57, No. 9, September 2010


  23. K.Prashanthi, M.Mandal, K. Dhale, P. Pant, S.P.Duttagupta, V.Ramgopal Rao and V.R.Palkar, "Nanomechanical Characterization of Multiferroic Thin Films for MEMS", Accepted, to appear in International Journal of Nanoscience, 2010


  24. Anshuman Kumar, Ramesh R. Navan, A.Kushwaha, M. Aslam and V. Ramgopal Rao, "Performance Enhancement of p-type Organic Thin Film Transistors using Zinc Oxide Nanostructures", Accepted, to appear in the International Journal of Nanoscience, 2010


  25. Ravishankar S. Dudhe, Jasmine Sinha, Anil Kumar and V. Ramgopal Rao,"Polymer composite-based OFET sensor with improved sensitivity towards nitro based explosive vapors", Sensors & Actuators: B. Chemical, Volume 148, Issue 1, 30 June 2010, Pages 158-165 2010 (Elsevier)


  26. Mayank Shrivastava, M. S. Baghini, D. K. Sharma and V. Ramgopal Rao, "A Novel Bottom Spacer Finfet Structure for Improved Short Channel, Power-Delay & Thermal Performance, IEEE Transactions on Electron Devices, Vol. 57, No. 6, Page(s): 1287 - 1294 June 2010


  27. Yusuke Kobayashi, Kazuo Tsutsui, Kuniyuki Kakushima, Parhat Ahmet, V. Ramgopal Rao and Hiroshi Iwai, "Analysis of Threshold Voltage Variation in Fin Field Effect Transistors (FinFETs) Separating Role of Short Channel Effects", Japanese Journal of Applied Physics, Vol. 49 (2010) 044201


  28. Manoj Joshi, Prasanna Gandhi, V.Ramgopal Rao and Soumyo Mukherji, "Design of Ultra Thin Affinity Cantilevers for Detection of Proteins", To appear in International Journal of Micro and Nano Systems, 2010


  29. Yusuke Kobayashi, Kuniyuki Kakushima, Parhat Ahmet, V. Ramgopal Rao, Kazuo Tsutsui and Hiroshi Iwai, "Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness", Microelectronics Reliability, Vol.50 (2010) Pages: 332-337


  30. S. Chabukswar, D. Maji, C. R. Manoj, K. G. Anil, V. Ramgopal Rao, F. Crupi, P. Magnone, G. Giusi, C. Pace, N. Collaert, "Implications of Fin Width Scaling on Variability and Reliability of High-k Metal Gate FinFETs", Microelectronic Engineering, Volume 87, Issue 10, October 2010, Pages 1963-196.


  31. M.A.Khaderbad, Urmimala Roy, M.Yedukondalu, M.Rajesh, M.Ravikanth and V.Ramgopal Rao, "Variable Interface Dipoles of Metallated Porphyrin Self-Assembled Monolayers for Metal-Gate Work Function Tuning in Advanced CMOS Technologies," IEEE Transactions on Nanotechnology, vol.9, no.3, Pages: 335-337, May 2010


  32. C. R. Manoj, Angada B. Sachid, Feng Yuan, Chang-Yun Chang, and V. Ramgopal Rao, "Impact of Fringe Capacitance on the Performance of Nanoscale FinFETs", IEEE Electron Device Letters, Vol. 31, Jan. 2010 Pages: 83-85


  33. Mayank Shrivastava, M.S.Baghini, Harald Gossner and V. Ramgopal Rao, "Mixed Signal Performance of Various High Voltage Drain Extended MOS Devices: PART 1", IEEE Transactions on Electron Devices, Vol. 57, February 2010, Pages: 448-457


  34. Mayank Shrivastava, M.S.Baghini, Harald Gossner and V. Ramgopal Rao, "A Novel Scheme to Optimize the Mixed Signal Performance and Hot Carrier Reliability of Drain Extended MOS Devices: PART 2", IEEE Transactions on Electron Devices, Vol. 57, February 2010, Pages: 458-465


  35. Kobayashi Y., Sachid A. B., Tsutsui K., Kakushima K., Ahmei P., V. Ramgopal Rao and Iwai H., "Analysis of threshold voltage variations of FinFETs relating to short channel effects", Electro-Chemical-Society (ECS) Transactions, Volume 16, Issue 40, 2009, Pages: 23-27


  36. Seena.V, Anukool Rajorya, Prita Pant, Soumyo Mukherji and V.Ramgopal Rao, "Polymer microcantilever biochemical sensors with integrated polymer composites for electrical detection", Solid State Sciences (Elsevier), Volume 11, Issue 9, September 2009, Pages: 1606-1611


  37. V. Hariharan, R. Thakker, K. Singh, A. B. Sachid, M. B. Patil, J. Vasi and V. Ramgopal Rao, "Drain Current Model for Nanoscale Double-Gate MOSFETs", Solid State Electronics (Elsevier), volume 53, Issue 9, year 2009, Pages: 1001-1008


  38. Harshil N. Raval, S.P. Tiwari, Ramesh R.N., S.G. Mhaisalkar and V. Ramgopal Rao, "Solution Processed Bootstrapped Organic Inverters based on P3HT with a High-K Gate dielectric Material", Volume 30, Issue 5, Pages: 484-486, IEEE Electron Device Letters, May 2009


  39. Mrinalini G. Walawalkar, Anil Kottantharayil and V. Ramgopal Rao, "Chemical Vapor Deposition Precursors for High Dielectric Oxides: Zirconium and Hafnium Oxide", Journal of Synthesis and Reactivity in Inorganic, Metal-Organic, and Nano-Metal Chemistry(SRMN),Taylor & Francis Group, 39:6, Pages: 331-340, 2009


  40. R. A. Thakker, C. Sathe, A. B. Sachid, M. S. Baghini, V. Ramgopal Rao and M. B. Patil, "A Novel Table-Based Approach for Design of FinFET Circuits", Pages: 1061-1070, IEEE Transactions on CAD, July 2009


  41. Seena.V, Nitin Kale, Sudip Nag, Manoj Joshi, Soumyo Mukherji and V.Ramgopal Rao, "Developing a polymeric microcantilever platform technology for biosensing applications", International Journal of Micro and Nano Systems, 1(1), 2009, Pages : 65-70 (Invited paper)


  42. Harshil N. Raval, Shree Prakash Tiwari, Ramesh R. N., and V. Ramgopal Rao, "Determining Ionizing Radiation using Sensors Based on Organic Semiconducting Material", APPLIED PHYSICS LETTERS 94, 123304, 2009


  43. D. Maji, F. Crupi, E. Amat, E. Simoen, B. De Jaeger, D.P. Brunco, C.R. Manoj, V. Ramgopal Rao, P. Magnone, G. Giusi, C. Pace, L. Pantisano, J. Mitard, R. Rodriguez and M. Nafria, "Understanding and Optimization of Hot Carrier Reliability in Germanium-on-Silicon pMOSFETs", IEEE Transactions on Electron Devices, VOL. 56, NO. 5, MAY 2009 Pages: 1063-1069


  44. Nitin S. Kale, Manoj Joshi, Nageswararao P, S. Mukherji and V. Ramgopal Rao, "Bio-functionalization of Silicon Nitride based Piezoresistive Microcantilevers", Sadhana, Indian Academy of Science Proceedings in Engineering Sciences, Vol. 34, Part 4, August 2009


  45. Pradeep Kumar Chawda, Bulusu Anand and V. Ramgopal Rao, "Optimum Body Bias Constraints for Leakage Reduction in High-K CMOS Circuits", Japanese Journal of Applied Physics, 48 (2009) 054501, May 2009


  46. Ravishankar S. Dudhe, S. P. Tiwari, Harshil N. Raval, Mrunal A. Khaderbad, Jasmine Sinha, M. Yedukondalu, M. Ravikanth, Anil Kumar and V.Ramgopal Rao, "Explosive vapour sensor using poly (3-hexylthiophene) and Cu-tetraphenyl-porphyrin composite based organic field effect transistors", Applied Physics Letters, Vol. 93, 263306 (2008); Published 31 December 2008 (For a NATURE India coverage of this article, please visit: http://www.nature.com/nindia/2009/090129/full/nindia.2009.14.html)


  47. P. Magnone, F. Crupi, G. Giusi, C. Pace, E. Simoen, C. Claeys, L. Pantisano, D. Maji, V. Ramgopal Rao and P. Srinivasan, "1/f noise in drain and gate current of MOSFETs with high-k gate stacks" IEEE Transactions on Device and Materials Reliability (TDMR), vol.9, no.2, Pages: 180-189, June 2009(Invited)


  48. Venkatnarayan Hariharan, Juzer Vasi and V. Ramgopal Rao, "A CAD-Compatible Closed-form Approximation for the Inversion Charge Areal Density in Double-Gate MOSFETs", Solid State Electronics (Elsevier), Vol 53, issue 2, Pages: 218-224, Feb 2009


  49. Venkatnarayan Hariharan, Juzer Vasi and V. Ramgopal Rao, "An Improvement to the Numerical Robustness of the Surface Potential Approximation for Double-Gate MOSFETs", IEEE Transactions on Electron Devices, Vol. 56, No.3, Pages: 529-532, March 2009


  50. Nitin S. Kale, Sudip Nag, R. Pinto and V. Ramgopal Rao, "Fabrication and Characterization of a Polymeric Microcantilever with an Encapsulated Hotwire CVD Polysilicon Piezoresistor", (IEEE/ASME) Journal of Microelectromechanical Systems (J-MEMS), Volume 18, Issue 1, Feb. 2009 Pages: 79-87


  51. Venkatnarayan Hariharan, Juzer Vasi and V. Ramgopal Rao, "Drain Current Model Including Velocity Saturation for Symmetric Double-Gate MOSFETs", IEEE Transactions on Electron Devices, Volume 55, Issue 8, Pages: 2173-2180, Aug. 2008


  52. Debabrata Maji, Felice Crupi, Gino Giusi, Calogero Pace, Eddy Simoen, Cor Claeys and V. Ramgopal Rao, "DC and Noise Properties of the Gate Current in Epitaxial Ge p-Channel Metal Oxide Semiconductor Field Effect Transistors with TiN/TaN/HfO2/SiO2 Gate Stack", Applied Physics Letters, 92, 163508, April 2008


  53. Mayank Shrivastava, Maryam Shojaei Baghini, A.Sachid, Dinesh Kumar Sharma and V. Ramgopal Rao, "A Novel and Robust Approach for Common Mode FeedBack using IDDG FinFET", IEEE Transactions on Electron Devices 55 (11), Pages: 3274-3282, 2008


  54. S.P. Tiwari, Srinivas P, Shriram S, Nitin S. Kale, Subodh G Mhaisalkar and V. Ramgopal Rao, "Organic FETs with Hot-wire CVD (HWCVD) Silicon Nitride as a Passivation and Gate Dielectric Layer", Volume 516, Issue 5, Pages: 770-772, Thin Solid Films, January 2008


  55. Mrunal A. Khaderbad, S. Mukherji and V. Ramgopal Rao, "DNA Based Nanoelectronics", Recent Patents on Electrical Engineering, Volume 1, Number 2, June 2008, pp. 115-120 (Bentham Sciece Publishers)(Invited review article)(ISSN: 1874-4761), Volume 1, 2008)


  56. C.R.Manoj, Meenakshi N, Dhanya V. and V. Ramgopal Rao, "Device Design & Optimization Considerations for Bulk FinFETs", IEEE Transactions on Electron Devices, Vol. 55, No.2, Pages: 609-615, February 2008


  57. Angada B. Sachid, Manoj C. R., Dinesh K. Sharma and V. Ramgopal Rao, "Gate Fringe Induced Barrier Lowering in Underlap FinFET Structures and its Optimization", IEEE Electron Device Letters, Vol. 29, Issue 1, Pages: 128-130, January 2008


  58. T. Cahyadi, H. S. Tan, S. G. Mhaisalkar, P. S. Lee, F. Boey, Z.K. Chen, C. M. Ng, V. Ramgopal Rao and G. J. Qi, "Electret mechanism, hysteresis and ambient performance of sol-gel silica gate dielectrics in pentacene field-effect transistors", APPLIED PHYSICS LETTERS (published by the American Institute of Physics), vol. 91, 242107, 2007


  59. R. Rajwade, P.D. Kulkarni, S. Mukherji, K.K. Rao and V. Ramgopal Rao, "Polymerization on DNA Templates for Nanoelectronics Applications", Journal of Scanning Probe Microscopy, Volume 2, No.1, June, 2007 , Pages: 32-35(4), American Scientific Publishers


  60. P. Tiwari, E. B. Namdas, V. Ramgopal Rao, and S. G. Mhaisalkar, "Solution processed n-type Organic Field Effect Transistors with high ON/OFF current ratios based on fullerene derivatives" IEEE Electron Device Letters, Vol. 28, Issue: 10, Page: 880, 2007


  61. Debabrata Maji, S. P Duttagupta, V. Ramgopal Rao, Chia Ching Yeo and Byung-Jin Cho, "Border Trap Characterization in High-k strained-Si MOSFETs", IEEE Electron Device Letters, Vol. 28, Page: 731, Issue:8, August 2007


  62. Yusuke Kobayashi, C. Raghunathan Manoj, Kazuo Tsutsui, Venkanarayan Hariharan, Kuniyuki Kakushima, V. Ramgopal Rao, Parhat Ahmet and Hiroshi Iwai, "Parasitic effects in multi-gate MOSFETs", IEICE Transactions on Electronics, Vol. 90, No. 10. Pages: 2051-2056 (Oxford University Press)


  63. C.R.Manoj and V. Ramgopal Rao, "Impact of High K Gate Dielectrics on the Device and Circuit Performance of Nanoscale FinFETs", IEEE Electron Device Letters, Vol. 28, Issue: 4, Page: 295, April 2007


  64. Manoj Joshi, Nitin Kale,S.Mukherji, R.Lal and V.Ramgopal Rao, "Affinity Cantilever Sensors for Cardiac Diagnostics", Indian Journal of Pure & Applied Physics, Vol 45, Pages: 287-293, April 2007


  65. Manoj Joshi, Nitin Kale, Rakesh Lal, V. Ramgopal Rao and Soumyo Mukherji, "A Novel Dry Method for Surface Modification of SU-8 for Immobilization of Biomolecules in Bio-MEMS", Biosensors and Bioelectronics, vol. 22, no.11, Pages: 2429-2435, May 2007


  66. T. Cahyadia, J. N. Tey, S. G. Mhaisalkar,V. Ramgopal Rao, R. Lal, Z. H. Huang and G. J. Qi, "Investigations of enhanced device characteristics in pentacene-based field-effect transistors with sol-gel interfacial layer", Applied Physics Letters, 90(11): 056711, 2007


  67. S. Chakraborty, A. Mallik, C. K. Sarkar and V. Ramgopal Rao, "Impact of Halo Doping on the Subthreshold Performance of Deep Submicrometer CMOS Devices and Circuits for Ultra Low Power Analog/Mixed-Signal Applications", IEEE Transactions on Electron Devices,Vol. 54, Pages: 241-248, February 2007


  68. Manoj Joshi, Richard Pinto, V. Ramgopal Rao and Soumyo Mukherji, "Silanization and Antibody Immobilization on SU-8", Applied Surface Science, Vol.253,No.6, Pages: 3127-3132, January, 2007


  69. K. Narasimhulu, I.Venkata Suryam Setty and V. Ramgopal Rao, "The Effect of Single Halo Doping on the Low-Frequency Noise Performance of Deep Sub-micron MOSFETs", IEEE Electron Device Letters,Volume 27,Issue 12, Pages: 995-997,December 2006


  70. Nitin S. Kale and V. Ramgopal Rao, "Design and Fabrication Issues in Affinity Cantilevers for bio-MEMS applications", (IEEE/ASME) Journal of Microelectromechanical Systems (J-MEMS), Volume 15, Issue 6, Pages: 1789 - 1794, December 2006


  71. Nitin Kale, Ashwani Mehta, Manoj Joshi, Soumyo Mukherjee, Rakesh Lal, R. Pinto, P. R. Apte and V. Ramgopal Rao, "Affinity cantilever and EIS based biosensors for Cardiac Diagnostics", ISRAPS (Indian Society for Radiation and Photochemical Sciences) Bulletin, Vol. 18, Pages: 24-29, October 2006 (Invited)


  72. Mayank Gupta, V.Vidya, V.Ramgopal Rao, Kun H. To and J.C.S.Woo, "Optimization of Sub-100 nm Gamma-gate Si-MOSFETs for RF Applications", Wireless Design and Development magazine (Featured Technology Article), December 2005 (Invited)


  73. Neeraj K. Jha, P. Sahajananda Reddy, D.K. Sharma and V. Ramgopal Rao, "NBTI Degradation and its Impact for Analog Circuit Reliability", IEEE Transactions on Electron Devices, Pages: 2609-2615, December 2005


  74. Amarchand Sathyapalan, Anup Lohani, Sangita Santra, Saurabh Goyal, M. Ravikanth, Soumyo Mukherj and V. Ramgopal Rao, "Preparation, characterization and electrical properties of a novel self-assembled meso-pyridyl pophyrin monolayer on gold surfaces", Australian Journal of Chemistry, Vol.58, Pages: 810-816, 2005


  75. Neeraj K. Jha and V. Ramgopal Rao, "A New Oxide Trap Assisted NBTI Degradation Model", IEEE Electron Device Letters, Volume: 26, Issue: 9, September 2005, Pages: 687-689


  76. M. V. Rammohan Reddy, D. K. Sharma, M. B. Patil and V. Ramgopal Rao, "Power-Area Evaluation of Various Double-Gate RF Mixer Topologies", IEEE Electron Device Letters, Volume: 26, Issue: 9, June 2005, Pages: 664–666


  77. D. V. Kumar, K. Narasimhulu, P. S. Reddy, M. Shojaei, D. K. Sharma, M. B. Patil and V. Ramgopal Rao, "Evaluation of the Impact of Layout on Device and Analog Circuit Performance with Lateral Asymmetric Channel MOSFETs", IEEE Transactions on Electron Devices, Volume 52, Issue 7, July 2005 Pages: 1603-1609


  78. Najeeb-ud-din, V. Ramgopal Rao and J. Vasi, "Design of 0.1 um single halo (SH) thin film silicon-on-insulator (SOI) MOSFETs for analog applications", Semiconductor Science and Technology, vol. 20, Pages: 895-902, 2005 (IOP Publishing Ltd, UK)


  79. Najeeb-ud-din, V. Ramgopal Rao, J. Vasi, and J. C. S. Woo, "Superior Hot Carrier Reliability of Single Halo (SH) Silicon-on-Insulator (SOI) nMOSFET in Analog Applications", IEEE Transactions on Device and Materials Reliability, Volume 5, Issue 1, Pages: 127 - 132, 2005


  80. Pradeep Kumar Chawda, Bulusu Anand and V. Ramgopal Rao, "Optimum Body Bias Constraints for Leakage Reduction in High-K CMOS Circuits", Japanese Journal of Applied Physics, April, 2005


  81. K. Narasimhulu, V. Ramgopal Rao, "Deep Sub-micron Device and Analog Circuit Parameter Sensitivity to Process Variations with Halo Doping and Its Effect on Circult Linearity", Japanese Journal of Applied Physics, April, 2005


  82. K. Narasimhulu, Madhav P. Desai, Siva G. Narendra and V. Ramgopal Rao, "The Effect of Lateral Asymmetric Channel (LAC) Doping on Deep Sub-micron Transistor Capacitances and its Influence on Device RF Performance", IEEE Transactions on Electron Devices, Volume: 51, Issue: 9, Sept. 2004, Pages: 1416–1423


  83. B. Anand, M. P. Desai, and V. Ramgopal Rao, "Silicon Film Thickness Optimization for SOI-DTMOS from Circuit Performance considerations", IEEE Electron Device Letters, Volume: 25, Issue: 6 , June 2004, Pages: 436–438


  84. V. Ramgopal Rao, "Nanotechnology-A revolution in progress", 'Electrical & Electronics' magazine, June, 2004 (Invited)


  85. K. N. Manjularani, V. Ramgopal Rao and J. Vasi, "Reliability of Ultrathin JVD Silicon Nitride MNSFETs under High Field Stressing", IEEE Transactions on Device and Materials Reliability, Vol.4, Pages: 18-23, March 2004


  86. V. Ramgopal Rao and Nihar R. Mohapatra, "Device and Circuit Performance issues with Deeply Scaled High-K MOS Transistors", Journal of Semiconductor Technology and Science (JSTS), Korea, Special issue on Scaled Nano Devices, Pages: 52-62, Vol. 4, No. 1, March,2004.(Invited)


  87. Samadhan B. Patil, Anand V. Vairagar, Alka A. Kumbhar, Laxmi K. Sahu, V. Ramgopal Rao, N. Venkatramani, R. O. Dusane and B. Schroeder, "Highly Conducting P+- PolySi Deposited by HWCVD and its Applicability As Gate Material for CMOS Devices", Thin Solid Films, Vol.430, 2003, Pages: 63-66


  88. Nihar R. Mohapatra, Madhav P. Desai, Siva. G. Narendra and V. Ramgopal Rao, "Modeling of Parasitic Capacitances in Deep Sub-micrometer Conventional and High-K dielectric MOS Transistors", IEEE Transactions on Electron Devices, vol. 50, No.4, Pages: 959-966, 2003


  89. K. N. Manjularani, V. Ramgopal Rao and J. Vasi, "A New Method to Characterize Border Traps in Sub-Micron Transistors using Hysteresis in the Drain Current", IEEE Transactions on Electron Devices, vol. 50, No.4, Pages: 973-979, 2003


  90. Parag C. Waghmare, Samadhan B. Patil, Alka A. Kumbhar, Laxmi Sahoo, V. Ramgopal Rao and R.O. Dusane, "Nitrogen dilution effects on structural and electrical properties of hot wire deposited a-SiN:H films for Deep Sub-micron CMOS Technologies", Thin Solid Films, Vol.430, 2003, Pages: 189-191


  91. N. R. Mohapatra, D. R. Nair, S. Mahapatra, V. Ramgopal Rao, S. Shukuri and J. D. Bude, "CHISEL programming Operation of Scaled NOR Flash EEPROMs-Effect of Voltage Scaling, Device Scaling, and Technological Parameters", IEEE Transactions on Electron Devices, vol. 50, Pages: 2104-2111, October 2003


  92. K. Narasimhulu, D. K. Sharma and V. Ramgopal Rao, "Impact of Lateral Asymmetric Channel Doping on Deep Sub-Micrometer Mixed-Signal Device and Circuit Performance", IEEE Transactions on Electron Devices vol. 50, Pages: 2481-2489, December 2003


  93. Parag C. W, Samadhan Patil, Alka Kumbhar, R. O. Dusane and V. Ramgopal Rao, "Ultra thin Silicon Nitride by Hot Wire CVD for Deep Sub-Micron CMOS Technologies", Microelectronic Engineering, Vol. 61-62, Pages: 625-629, 2002


  94. Najeeb-ud-din, Mohan V. Dunga, Aatish Kumar, J. Vasi, V. Ramgopal Rao, Baohong Cheng and J. C. S. Woo, "Analysis of Floating Body Effects in Thin Film Conventional and Single Pocket SOI MOSFETs using the GIDL Current Technique", IEEE Electron Device Letters, vol. 23, Pages: 209-211, April 2002


  95. D. G. Borse, Manjula Rani K. N., Neeraj K. Jha, A. N. Chandorkar, J. Vasi, V. Ramgopal Rao, B. Cheng, J. C. S. Woo, "Optimization and Realization of Sub 100nm Channel Length Single Halo p-MOSFETs", IEEE Transactions on Electron Devices, vol.49, (no.6), June 2002.


  96. Nihar R. Mohapatra, Madhav P. Desai, Siva G. Narendra and V. Ramgopal Rao, "The Effect of High-K Gate Dielectrics on Deep Sub-micrometer CMOS Device and Circuit Performance" IEEE Transactions on Electron Devices, vol.49, (no.5), May 2002, Pages: 826- 831


  97. Shantanu Rastogi, Ritesh Jhaveri, S.Mukherji, M.Ravikanth and V.Ramgopal Rao, "Status and Trends in Molecular Electronics", Special issue of IETE Technical Review on Nano Technology, Volume 19, No.5, Pages: 305-313, October 2002 (Invited)


  98. Abhay Porwal, Mayur Narsude, Soumyo Mukherji and V.Ramgopal Rao, "Microcantilever Based Biosensors", Special issue of IETE Technical Review on Nano Technology, Volume 19, No.5, Pages: 293-303, October 2002 (Invited)


  99. S. Mahapatra, V. Ramgopal Rao, B. Cheng, M. Khare, C. D. Parikh, J. C. S. Woo and J. Vasi, "Performance and Hot-Carrier Reliability of 100 nm Channel Length Jet Vapor Deposited Si3N4 MNSFETs", IEEE Transactions on Electron Devices, vol.48, (no.4), April 2001. Pages: 679-84


  100. S. Mahapatra, V. Ramgopal Rao, B. Cheng, J.Vasi and J. C. S. Woo, "A Study of Hot-Carrier Induced Interface-Trap Profiles in Lateral Asymmetric Channel MOSFETs Using a Novel Charge Pumping Technique", Solid State Electronics, Vol. 45, Pages: 1717-1723, 2001


  101. Nihar R. Mohapatra, A. Dutta, G. Sridhar, M. P. Desai and V. Ramgopal Rao, "Sub 100 nm CMOS Circuit Performance with High-K Gate Dielectrics", Microelectronics Reliability, Vol. 41, Pages: 1045-1048, 2001


  102. Aatish Kumar, Souvik Mahapatra, Rakesh Lal and V. Ramgopal Rao, "Multi-Frequency Transconductance Technique for Interface Characterization of Deep Sub-Micron SOI-MOSFETs", Microelectronics Reliability, Vol. 41, Pages: 1049-1051, 2001


  103. Samadhan B. Patil, A. Kumbhar, P. Waghmare, V. Ramgopal Rao and R. O. Dusane, "Low Temperatue Silicon Nitride deposited by Hot-Wire CVD for Deep Sub-micron CMOS Devices", Thin Solid Films, Vol. 395, Pages: 270-274, 2001


  104. Aatish Kumar, Rakesh Lal, and V. Ramgopal Rao, "A Simple and Direct Technique for Interface Characterization of SOI MOSFETs and its Application in Hot Carrier Degradation Studies in Sub 100 nm JVD MNSFETs", Microelectronic Engineering, Vol. 59, Pages: 429-433, 2001


  105. Kottantharayil Anil, Souvik Mahapatra, V. Ramgopal Rao and I. Eisele, "Comparison of Sub-Bandgap Impact Ionization in Sub-100 nm Conventional and Lateral Asymmetrical Channel nMOSFETs", Japanese Journal of Applied Physics, Vol. 40 (2001) 2621-2626, Part 1, No. 4B, 30 April 2001


  106. S. Mahapatra, C. D. Parikh, V. Ramgopal Rao, C. R. Viswanathan and J. Vasi, "A Comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique", IEEE Transactions on Electron Devices, vol. 47, Pages: 171-178, January, 2000


  107. S. Mahapatra, C. D. Parikh, V. Ramgopal Rao, C. R. Viswanathan and J. Vasi, "Device Scaling Effects on Hot-Carrier Induced Interface and Oxide Trap Distributions in MOSFETs", IEEE Transactions on Electron Devices, vol. 47, Pages: 789-796, April 2000


  108. B. Cheng, V. Ramgopal Rao and J. C. S. Woo, "Exploration of Velocity Overshoot in a High-Performance Deep sub 100 nm SOI MOSFET with Asymmetric Channel Profile", IEEE Electron Device Letters, vol. 20, Pages: 538-540, October 1999


  109. B. Cheng, M. Cao, V. Ramgopal Rao, A. Inani, P. V. Voorde, W. Greene, Z. Yu, H. Stork and J. C. S. Woo, "The impact of high-k gate dielectrics and metal gate electrode on sub 100 nm MOSFETs", IEEE Transactions on Electron Devices, vol. 46, Pages: 1537, 1999


  110. A. Inani, V. Ramgopal Rao, B. Cheng, and J. C. S. Woo, "Gate Stack Architecture Analysis and Channel Engineering in Deep Sub-Micron MOSFETs", Japanese Journal of Applied Physics, Part 1, April 1999, vol.38, (no.4B): Pages: 2266-71


  111. S. Mahapatra, C. D. Parikh, J. Vasi, V. Ramgopal Rao and C. R. Viswanathan, "A Direct Charge Pumping Technique for Spatial Profiling of Hot-Carrier Induced Interface and Oxide Traps in MOSFETs", Solid State Electronics, Page: 915, vol. 43, 1999


  112. V. Ramgopal Rao, W. Hansch, S. Mahaptra, D. K. Sharma, J. Vasi, T. Grabolla and I.Eisele, "Low Temperature-High Pressure Grown Thin Gate Dielectrics for MOS Applications", Microelectronic Engineering, vol. 48, Pages: 223-226, 1999


  113. S. Mahapatra, V. Ramgopal Rao, C. D. Parikh, J. Vasi, B. Cheng and J. C. S.Woo, "A Study of 100 nm Channel Length Asymmetric MOSFETs by Using Charge Pumping", Microelectronics Engineering, vol. 48, Pages: 193-196, 1999


  114. W. Hansch, V. Ramgopal Rao, C. Fink, F. Kaesen and I. Eisele, "Electric Field Tailoring in MBE Grown Vertical Sub-100 nm MOSFETs", Thin Solid Films, vol..321, Pages: 206-214, 1998


  115. T. Brozek, V. Ramgopal Rao, A. Sridharan, J. Werking, D. Chan and C. R. Viswanathan, "Charge Injection using Gate-Induced-Drain-Leakage Current for Characterization of Plasma Edge Damage in CMOS Devices", IEEE Transactions on Semiconductor Manufacturing, vol. 11 (2), May 1998


  116. C. R. Viswanathan and V. Ramgopal Rao, "Application of charge pumping technique for sub-micron MOSFET characterization", Microelectronic Engineering, vol.40, (no.3-4):Pages: 131-46, Nov. 1998


  117. A. Balandin, S. Cai, R. Li, K. L. Wang, V. Ramgopal Rao and C. R. Viswanathan, "Flicker Noise in GaN/Al0.15Ga0.85N Doped Channel Heterostructure Field Effect Transistors", IEEE Electron Device Letters, Page: 475, Vol. 19, 1998


  118. V. Ramgopal Rao, W. Hansch, H. Baumgartner, I. Eisele, D. K. Sharma and J. Vasi, "Charge Trapping Behavior in Deposited and Grown Oxides", Thin Solid Films, vol. 296, Page: 37, 1997


  119. V. Ramgopal Rao, I. Eisele, R. M. Patrikar, D. K. Sharma, J. Vasi and T. Grabolla, "High-Field Stressing of LPCVD Gate Oxides", IEEE Electron Device Letters, vol.18, Page: 84, 1997


  120. V. Ramgopal Rao, F. Wittmann, H. Gossner and I. Eisele, " Hysteresis Behaviour in 85 nm Channel Length Vertical MOSFETs Grown by MBE", IEEE Trans. on Electron Devices, vol. 43(6), Pages: 973, 1996


  121. V. Ramgopal Rao, D. K. Sharma and J. Vasi, "Neutral Electron Trap Generation under Irradiation in Reoxidised Nitrided oxide Gate Dielectrics", IEEE Trans. on Electron Devices, vol. 43, Pages: 1467, 1996


  122. V. Ramgopal Rao and J. Vasi, "Radiation induced interface state generation in reoxidised nitrided oxides", Journal of Applied Physics, 71(2), 1992


    123. INTERNATIONAL CONFERENCE PROCEEDINGS


  123. V. Seena, Sudip Nag, Sahir Gandhi, Dilip Agarwal, Gaurav Chatterjee, Sheetal Patil, S.Mukherji, Dinesh Sharma and V. Ramgopal Rao, "Low Cost Polymer Nano-mechanical Sensor Systems for Healthcare and Homeland Security Applications" Global Interposer Technology (GIT) Workshop: Design, Technologies, Applications, Markets and Manufacturing Infrastructure, November 14 – 15, 2011, Georgia Institute of Technology, Atlanta Georgia USA (Received the best Paper Award)


  124. Neena Gilda, Sheetal Patil, Seena V., Sanjay Joshi, Viral Thaker, Sanket Thakur, Anvesha A., M. Shojaei Baghini, D. K. Sharma, V. Ramgopal Rao, "Piezoresitive 6-MNA Coated Microcantilevers with Signal Conditioning Circuits for Electronic Nose Applications", Proceedings of the IEEE Asian Solid-State Circuits Conference (A-SSCC) 2011, Jeju, Korea, November 14-16, 2011


  125. Neena A. Gilda, Sandeep Surya, Sanjay Joshi, Viral Thaker, M. Shojaei Baghini, Dinesh K.Sharma, V. Ramgopal Rao, "A Low-Cost, Ultra Sensitive Hand-Held System for Explosive Detection using Piezo-Resistive Micro-Cantilevers", IEEE 8th International SoC Design Conference 2011 (ISOCC' 2011), November 17-18, 2011, Jeju, Korea (Invited)


  126. Sandeep Goud Surya, Sudip Nag, Sahir Gandhi, Dilip Agarwal, Gaurav Chatterjee and V. Ramgopal Rao, "Highly Sensitive R/R Measurement System for Nano-Electro-Mechanical-Cantilever Based Bio-sensors", IEEE International Symposium on Electronic System Design (ISED) 2011 19-21 December 2011, Kochi, India


  127. Harshil N. Raval and V. Ramgopal Rao, "Copper (II) Phthalocyanine Based Field Effect Transistors as Total Dose Sensors for Determining Ionizing Radiation Dose," 2011 MRS Fall Meeting, November 28 - December 2, 2011, Boston, Massachusetts, USA


  128. Harshil N. Raval and V. Ramgopal Rao, "OFET Sensors With Poly 3-hexylthiophene and Pentacene as Total Dose Detectors for Ionizing Radiation," 2011 MRS Fall Meeting, November 28 - December 2, 2011, Boston, Massachusetts, USA


  129. C.Vijaya Bhaskar Reddy, Mrunal A. Khaderbad, Sahir Gandhi, Sheetal Patil,Harshil N. Raval, K. Narasaiah Chetty, K. Govindha Rajulu, P. C. K. Chary, M. Ravikanth, V. Ramgopal Rao, "Fe(III)porphyrin functionalized Piezo-resistive SU-8micro-cantilever as a CO sensor," 2011 MRS Fall Meeting, November 28 - December 2, 2011, Boston, Massachusetts, USA


  130. V. Seena, Prasenjit Ray, Rohit V. Pandharipande, Prakash R. Apte and V. Ramgopal Rao, "A Novel High Yield Microfabrication Process and Porphyrin SAM functionalization for Polymeric piezoresistive Microcantilevers for Biochemical Sensing," 2011 MRS Fall Meeting, November 28 - December 2, 2011, Boston, Massachusetts, USA


  131. M. A. Khaderbad, R. Pandharipande, A. Gowtham, A. Mishra, M. Bhaisare, A. Kottantharayil, Y. Meesala, M. Ravikanth and V. Ramgopal Rao, "Bottom-up Method for Work Function Tuning in High-k/Metal Gate Stacks in Advanced CMOS Technologies", 2011 IEEE Nanotechnology Conference, Portland, Oregon, USA, August 15-18 2011


  132. K. Prashanthi, M. Naresh, V. Seena, T. Thundat, V.Ramgopal Rao, "Photo-patternable piezoelectric SU-8/ZnO nanocomposites for MEMS", 8th International Workshop on Nanomechanical Sensing, May 11- 13, 2011 Dublin, Ireland


  133. Mrunal A. Khaberbad, V. Tjoa, N. Mathews, M. Sheri, M. Ravikanth, V. Ramgopal Rao and S. Mhaisalkar, "Photoinduced Interactions Between Porphyrins and Graphene", International Conference on Materials for Advanced Technologies or (ICMAT), June 26-July 1, 2011, Suntec, Singapore


  134. Mrunal A. Khaderbad, Manohar Rao, Jinesh Kochupurackal, S. Madhu, M. Ravikanth, V. Ramgopal Rao and S. G. Mhaisalkar, "Effect of Central Metal Ion on Molecular Dipole in Porphyrin Self-Assembled Monolayers", International Conference on Materials for Advanced Technologies or (ICMAT), June 26-July 1, 2011, Suntec, Singapore


  135. Mayank Shrivastava, Manish Agrawal, Jasmin Aghassi, Harald Gossner, Wolfgang Molzer, Thomas Schulz, V. Ramgopal Rao, "On the Thermal Failure in Nanoscale Devices: Insight towards Heat Transport Including Critical BEOL and Design Guidelines for Robust Thermal Management & EOS/ESD Reliability", 2011 IEEE International Reliability Physics Symposium (IRPS), April 10-14, Monterey, CA, USA


  136. Prasenjit Ray, V. Ramgopal Rao and P. R. Apte, "Optimum design of SU-8 based accelerometer with reduced cross axis sensitivity", Proceedings of the 2010 IEEE International Conference on Semiconductor Electronics (ICSE), pages: 289 - 292, Melaka, Malaysia


  137. Prasenjit Ray, P.R. Apte and V. Ramgopal Rao, "A 8-Resistor SU-8 Accelerometer with Reduced Cross Axis Sensitivity", 2010 IEEE Asia Pacific Conference on Circuits and Systems (APCCS), Dec 6-9, 2010, Kuala Lumpur, Malaysia


  138. Mayank Shrivastava, Harald Gossner, M.S.Baghini and V. Ramgopal Rao, "A 3D TCAD Based Approach for the Evaluation of Nanoscale Devices During ESD Failure", 7th International SoC Design Conference (ISOCC 2010), November 22-23, 2010, Songdo ConvensiA, Incheon, Korea (Invited special session paper)


  139. Mayank Shrivastava, Harald Gossner, M. S. Baghini and V. Ramgopal Rao,"On the Transient Behavior of Various Drain Extended MOS Devices under the ESD stress condition", 7th International SoC Design Conference (ISOCC 2010), November 22-23, 2010, Songdo ConvensiA, Incheon, Korea (Invited special session paper)


  140. Angada B. Sachid, Maryam Shojaei Baghini, Dinesh K. Sharma and V. Ramgopal Rao, "Alternate Scaling Strategies for Multi-Gate FETs for High-Performance and Low-Power Applications", 7th International SoC Design Conference (ISOCC 2010), November 22-23, 2010, Songdo ConvensiA,Incheon, Korea (Invited special session paper)


  141. V.Ramgopal Rao, V. Seena, Nitin Kale, Abhinav Prasad, Sheetal Patil, Deepika Reddy, Dilip Agarwal, Sahir Gandhi and Soumyo Mukherji, "An Ultra-Sensitive Polymer Composite Lab-on-Chip Platform for Disposable Cardiac Diagnostic Applications", 2010 MRS Fall Meeting, November 29-December 3, 2010 Boston, Massachusetts, USA (Invited paper)


  142. Prasenjit Ray, V. Seena, Rupesh A.Khare, Arup R.Bhattacharyya, Prakash R.Apte and V. Ramgopal Rao, "SU8/ Na-AHA modified MWNT composite for piezoresistive sensor applications", 2010 MRS Fall Meeting, November 29-December 3, 2010 Boston, Massachusetts, USA


  143. prasenjit Ray, V. Seena, Prakash R. Apte and V. Ramgopal Rao, "A High Yield Polymer MEMS Process for CMOS/MEMS Integration" 2010 MRS Fall Meeting, November 29-December 3, 2010 Boston, Massachusetts, USA


  144. Harshil N. Raval and V. Ramgopal Rao, "Ionizing Radiation Total Dose Detectors Using Oligomer Organic Semiconductor Material and Devices", 2010 MRS Fall Meeting, November 29-December 3, 2010 Boston, Massachusetts, USA


  145. Rajashree Rajagopal, S. N. Kale, R. Pinto and V. Ramgopal Rao, "CMOS Compatible Process Development & Optimization of La0.7Sr0.3MnO3 (LSMO)/Si Heterojunctions", 2010 MRS Fall Meeting, November 29-December 3, 2010 Boston, Massachusetts, USA


  146. Prasenjit Ray, V. Ramgopal Rao and Prakash R. Apte, "Optimum design of SU-8 based accelerometer with reduced cross axis sensitivity", 2010 IEEE International Conference on Semiconductor Electronics, June 28-30, 2010 Malaysia.


  147. Ravishankar S. Dudhe, Anand Sutar, Jasmine Sinha, Anil Kumar and V. Ramgopal Rao, "Poly (3-hexylthiophene) and hexafluoro-2-propanol-substituted polysiloxane based OFETs as a sensor for explosive vapor detection", European Materials Research Symposium (E-MRS) 2010 Spring Meeting Strasbourg, France, June 7 to 11, 2010.


  148. V Seena, Sudip Nag, Sheetal Patil, Soumyo Mukherji and V Ramgopal Rao, "An Ultra Sensitive Polymer Composite Microcantilever Platform for Explosive Detection", 7 th International Workshop on Nanomechanical Cantilever Sensors, May 26-28, 2010 Banff, Canada (Invited)


  149. Mayank Shrivastava, Jens Schneider, M. S. Baghini, H. Gossner and V. Ramgopal Rao, "On the Failure Mechanism and Current Instabilities in Resurf Type DENMOS Device Under ESD Conditions", Proceedings of the 2010 IEEE International Reliability Physics Symposium (IRPS), Anaheim, California, May 2-6, 2010.


  150. Mayank Shrivastava, S. Bychikhin, D. Pogany, J. Schneider, M. S. Baghini, H. Gossner, Erich Gornik and V. Ramgopal Rao, "On the Differences between 3-D Filamentation and Failure of N&P Type Drain Extended MOS Devices under ESD Condition", Proceedings of the 2010 IEEE International Reliability Physics Symposium (IRPS), Anaheim, California, May 2-6, 2010.


  151. R. A. Thakker, A. B. Sachid, C. Sathe, M. S. Baghini, D. K. Sharma, V. Ramgopal Rao and M. B. Patil, "Auto-BET-AMS: An Automated Device and Circuit Optimization Platform to Benchmark Emerging Technologies for Performance and Variability using an Analog and Mixed-Signal Design Framework", Proceedings of the 11th International Symposium on Quality Electronic Design (ISQED 2010), San Jose, CA, USA, March 22-24, 2010.


  152. Mayank Shrivastava, Bhaskar Verma, M. Shojaei Baghini, Christian Russ, Dinesh K. Sharma, Harald Gossner and V. Ramgopal Rao, "BENCHMARKING THE DEVICE PERFORMANCE AT SUB 22 NM NODE TECHNOLOGIES USING AN SoC FRAMEWORK", Proceedings of the INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), Baltimore, December 7 - 9, 2009.


  153. Mayank Shrivastava, S. Bychikhin, D. Pogany, Jens Schneider, M. Shojaei Baghini, Harald Gossner, Erich Gornik and V. Ramgopal Rao, "FILAMENT STUDY OF STI TYPE DRAIN EXTENDED NMOS DEVICE USING TRANSIENT INTERFEROMETRIC MAPPING", Proceedings of the INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), Baltimore, December 7 - 9, 2009.


  154. V. Seena, A. Rajorya, A. Fernaundus, K. Dhale, P. Pant, S. Mukherji, V. Ramgopal Rao, "Fabrication and Characterization of a Novel Polymer Composite Microcantilever Sensors for Explosive Detection", Proceedings of the 23rd IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2010), January 24-28, 2010, Hong Kong Convention and Exhibition Center, Hong Kong.


  155. Ravishankar S.Dudhe, Seena V, Soumyo Mukherji, Anil Kumar and V. Ramgopal Rao, "Organic Sensors for Explosive Detection", Proceedings of the International Conference on Computers and Devices for Communication (CODEC), December 14- 16, 2009, Hyatt Regency, Kolkata (Invited).


  156. Ramesh R. Navan, Harshil N. Raval, M. Shojaei Baghini and V. Ramgopal Rao, "Low Voltage Patterned Gate Pentacene Organic Circuits with Hafnium oxide High-K Gate Dielectric", Proceedings of the 7th Organic Semiconductor Conference (OSC-09), 28-30 September 2009, London Heathrow Marriott, London, UK.


  157. K. Prashanthi, M. Mandal, S.P. Duttagupta, Prita Pant, V. R. Palkar and V. Ramgopal Rao, "Characterization of Multiferroic Thin Films Directly Deposited on Silicon for Novel Device Applications", Proceedings of the 2010 IEEE International NanoElectornics Conference, January 3-10, 2010 Hong Kong, China.


  158. Rohit V. Pandharipande, Ramesh R.Navan, Urmimala Roy, Mrunal K.Khaderbad, M. Yedukondalu, M. Ravikanth and V.Ramgopal Rao, "Threshold Voltage tuning of Pentacene OFETs using Self Assembled Monolayer of Metallated Porphyrin" International Conference on Nano Science and Technology, Mumbai, India, February 17-20, 2010.


  159. Seena V, Avil Fernandes, Soumyo Mukherji, V.Ramgopal Rao, "Photoplastic Microcantilever Sensor Platform for Explosive Vapor Detection", International Conference on Nano Science and Technology, Mumbai, India, February 17-20, 2010.


  160. K. Prashanthi, M.Mandal, D. Karuna, P. Pant, S.P. Duttagupta, V. Ramgopal Rao and V.R. Palkar, "Nanomechanical Characterization of Multiferroic Thin Films for MEMS", International Conference on Nano Science and Technology, Mumbai, India, February 17-20, 2010.


  161. Anshuman Kumar, Ramesh R. Navan, Ajay Kushwaha , M. Aslam and V. Ramgopal Rao, "Performance Enhancement of p-type Organic Thin Film Transistors using Zinc Oxide Nanostructures", International Conference on Nano Science and Technology, Mumbai, India, February 17-20, 2010.


  162. Sudip Nag, Nitin S. Kale, V. Ramgopal Rao and Dinesh K. Sharma, "An Ultra-sensitive ?R/R Measurement System for Biochemical Sensors using Piezoresistive Micro-Cantilevers", 31st Annual International Conference of theIEEE Engineering in Medicine and Biology Society (EMBC'09), Minneapolis, Minnesota, USA, 2nd-6th September, 2009


  163. Mayank Shrivastava, Jens Schneider, Ruchil Jain, Maryam Shojaei Baghini, Harald Gossner and V. Ramgopal Rao, "IGBT Plugged in SCR Device for ESD Protection in Advanced CMOS Technology", 31st IEEE Annual InternationaEOS/ESD Symposium, August 30-September 4, 2009, Anaheim, CA, USA


  164. A. V. Govindarajan, Satyavalli Paluri, Anirudh Sharma, V. Ramgopal Rao and K. F. Bohringer, "Selective Vapor Liquid Solid Growth of Needle Arrays by Hot Wire Chemical Vapor Deposition with Low Substrate temperature", TRANSDUCERS'09: The 15th International Conference on Solid-State Sensors, Actuators and Microsystems", June 21-25, 2009 Denver, Colorado USA


  165. Mayank Shrivastava, Jens Schneider, Maryam Shojaei Baghini, Harald Gossner and V. Ramgopal Rao, "Highly resistive body STI: n-DEMOS: An optimized DEMOS device to achieve moving current filaments for robust ESD protection", Proceedings of the 2009 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), April 26 - 30, 2009, Montreal, Quebec, Canada


  166. Mayank Shrivastava, Jens Schneider, Maryam Shojaei Baghini, Harald Gossner and V. Ramgopal Rao, "A New Physical Insight and 3D Device Modeling of STI Type DENMOS Device Failure under ESD Conditions", Proceedings of the 2009 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), April 26 - 30, 2009, Montreal, Quebec, Canada


  167. G. Naga Siva Kumar, Sushanta K. Mitra and V. Ramgopal Rao, "Fabrication of a Dielectrophoretic Microfluidic Device", Proceedings of Seventh International ASME Conference on Nanochannels, Microchannels and Minichannels, June 22-24, 2009, Pohang, South Korea


  168. Angada B. Sachid, Giri S. Kulkarni, Maryam S. Baghini, Dinesh K. Sharma and V. Ramgopal Rao, "Highly Robust Nanoscale Planar Double-Gate MOSFET Device and SRAM Cell Immune to Gate-Misalignment and Process Variations", Proceedings of the IEEE International Workshop on Electron Devices & Semiconductor Technology, June 1-2, 2009, Mumbai, India


  169. Urmimala Roy, Mrunal A. Khaderbad, M. Yedukondalu, M. Ravikanth, S. Mukherji and V. Ramgopal Rao, "Hydroxy-phenyl Zn(II) Porphyrin Self-Assembled Monolayer as a Diffusion Barrier for Copper-Low k Interconnect Technology", Proceedings of the IEEE International Workshop on Electron Devices & Semiconductor Technology, June 1-2, 2009, Mumbai, India


  170. D. Maji, F. Crupi, P. Magnone, G. Giusi, C. Pace, E. Simoen and V. Ramgopal Rao, "Characterization of Interface and Oxide Traps in Ge pMOSFETs based on DCIV Technique", Proceedings of the IEEE International Workshop on Electron Devices & Semiconductor Technology, June 1-2, 2009, Mumbai, India


  171. Ramesh R. Navan, Rajesh A. Thakker, S. P. Tiwari, M. Shojaei Baghini, M. B. Patil, S. G. Mhaisalkar and V. Ramgopal Rao, "DC & Transient Circuit Simulation Methodologies for Organic Electronics", Proceedings of the IEEE International Workshop on Electron Devices & Semiconductor Technology, June 1-2, 2009, Mumbai, India


  172. Angada B. Sachid, M. Srivastava, R. A. Thakker, M. Shojaei Baghini, D. K. Sharma, M. B. Patil and V. Ramgopal Rao, "Technology-Aware Design (TAD) for Sub-45nm CMOS Technologies", Intel Asia Academic Forum 2008, 20-22 Oct 2008, Taipei, Taiwan (received the best research paper award)


  173. Rajesh A. Thakker, Chaitanya Sathe, Angada B.Sachid, Maryam Shojaei Baghini, V. Ramgopal Rao, Mahesh B. Patil, "Automated Design and Optimization of Circuits in Emerging Technologies", Proceedings of the 14th Asiaand South Pacific Design Automation Conference" (ASP-DAC 2009), Jan. 19-22 2009, Yokohama, Japan


  174. Ravishankar S. Dudhe, Prashant Mishra, Jasmine Sinha, Anil Kumar, V. Ramgopal Rao, "A MWCNT/P3HT Based chemiresistor for RDX Detection", Proceedings of the International Conference on MEMS, Chennai, India January 3-5, 2009


  175. Angada B. Sachid, Roswald Francis, M. S. Baghini, D. K. Sharma, Karl-Heinz Bach, R. Mahnkopf and V. Ramgopal Rao, "Sub-20 nm gate length FinFET design: Can high-? spacers make a difference?" Proceedings of the "INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)", San Francisco, CA, December 15-17, 2008


  176. Seena. V, Nitin. S. Kale, Anukool Rajoriya, Akash Nigam, Soumyo Mukherji and V.Ramgopal Rao, "Nano-Electro-Mechanical-systems for Cardiac Diagnostics", 2nd Bangalore Nano, Dec 11-13, 2008, Bangalore


  177. Y. Kobayashi, A. Sachid, K. Tsutsui, K. Kakushima, P. Ahmet, V. Ramgopal Rao and H. Iwai, "Analysis of Threshold Voltage Variations of FinFETs Relating to Short Channel Effects", Proceedings of the 214 th Meeting of The Electrochemical Society, October 12-17, 2008, Hawaii, USA


  178. Seena.V, Nitin.S.Kale, Soumyo Mukherji and V.Ramgopal Rao, "Development of polymeric microcantilevers with novel transduction schemes for biosensing applications", Proceedings of the 5 th International Workshop on Nanomechanical Cantilever Sensors, May 19 - 21, 2008, Mainz, Germany 2008


  179. Mrunal A. Khaderbad, Kaushik Nayak, M. Yedukondalu, M. Ravikanth, S. Mukherji and V.Ramgopal Rao, "Metallated Porphyrin Self Assembled Monolayers as Cu Diffusion Barriers for the Nano-scale CMOS Technologies", Proceedings of the 8th IEEE Conference on Nanotechnology (IEEE NANO 2008), August 18-21, 2008, Arlington, Texas USA


  180. Y. Kobayashi, K. Tsutsui, K. Kakushima, P. Ahmet, V. Ramgopal Rao and H. Iwai, "Analysis of Threshold Voltage Variations of FinFETs: Separation of Short Channel Effects and Space Charge Effects", Proceedings of theInternational Conference on Solid State Devices and Materials (SSDM 2008), September 23-26, 2008, Ibaraki, Japan


  181. Nitin S. Kale, Sudip Nag, R. Pinto and V. Ramgopal Rao, "Photoplastic NEMS with an Encapsulated Polysilicon Piezoresistor", Proceedings of the 8th IEEE Conference on Nanotechnology (IEEE NANO 2008), August 18-21, 2008, Arlington, Texas USA


  182. V. Seena, P. Nageswararao, S.Mukherji, Anil Kumar and V. Ramgopal Rao, "Polymer microcantilever biochemical sensors with integrated polymer composites for electrical detection", Proceedings of the European Materials Research Society Symposium, E-MRS spring meeting, Strasbourg, 25-29, May 2008


  183. V. Hariharan, R. Thakker, M. B. Patil, J. Vasi and V. Ramgopal Rao, "Closed Form Current and Conductance Model for Symmetric Double-Gate MOSFETs using Field-dependent Mobility and Body Doping", Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008 3, Pages: 857-860


  184. Seena.V, Nitin Kale, Sudip Nag, Manoj Joshi, Soumyo Mukherji and V.Ramgopal Rao, "Development of a polymeric microcantilever platform technology for biosensing applications", 5th International Conference on Smart Materials, Structures and Systems, July 24-26, 2008, Bangalore (Invited paper)


  185. V. Hariharan, Juzer Vasi and V. Ramgopal Rao, "Drain Current Model for Undoped Symmetric Double-Gate FETs using a Velocity Saturation Model with Exponent n=2", Proceedings of the 2007 International Semiconductor Device Research Symposium (ISDRS), Dec 12-14, 2007,Universit of Maryland,College Park, USA


  186. Nitin S. Kale, Manoj Joshi, S. Mukherji, V. Ramgopal Rao, "Bio-functionalization of Silicon Nitride based Piezoresistive Microcantilevers", Proceedings of the 10 th International Conference on Advanced Materials (ICAM), organized by the International Union of Materials Research Societies (IUMRS), October 8-13, 2007, Bangalore, India


  187. S. P. Tiwari, D. Maji, Srinivas P., Ramesh R. N., Harshil N. Raval and V. Ramgopal Rao, "Low Voltage Organic Circuits with Polythiophene Semiconductor and High-k Gate Dielectrics", Proceedings of the 10 th International Conference on Advanced Materials (ICAM), organized by the International Union of Materials Research Societies (IUMRS), October 8-13, 2007, Bangalore, India


  188. K. Nayak, Prasanna Kulkarni, Deepu A., V. Sitaraman, S. Punidha, A. Saha, M. Ravikanth, Sushanta Mitra, S. Mukherji and V. Ramgopal Rao, "Patterned Microfluidic Channels using Self-assembled Hydroxy-phenyl Porphyrin Monolayer", Proceedings of the 7th IEEE International Conference on Nanotechnology, August 2-5, 2007 Hong Kong


  189. C.R. Manoj, Meenakshi. N, Dhanya V. and V. Ramgopal Rao, "Optimization of Nano-scale Bulk FinFETs", Proceedings of the 14 th International Workshop on the Physics of Semiconductor Devices, Mumbai, December 16-20, 2007


  190. S. R. Rajwade, P. D. Kulkarni, S. Mukherji and V.Ramgopal Rao, "Polymerization on DNA Templates for Nanoelectronics Applications", Proceedings of the International Conference on Materials for Advanced Technologies (ICMAT), July 1-6, 2007, Singapore


  191. Manoj Joshi, Gajanan Nagre, Seena V., V. Ramgopal Rao and Soumyo Mukherji, "Functionalization of Hydrogen Silsesquioxane (HSQ) surface for biosensor applications", Proceedings of the European Materials Research Society (EMRS)Spring Meeting, MAY 28 to JUNE 1, 2007, Congress Center - STRASBOURG (France)


  192. A. V. Govindarajan, M. Joshi, S. Mukherji, V.Ramgopal Rao and K. F. Böhringer, "Engineering The Hydrophobicity Oxide Surfaces By Controlling The Dehydration Temperature Of Silanization", Proceedings of the European Materials Research Society (EMRS)Spring Meeting, MAY 28 to JUNE 1, 2007, Congress Center - STRASBOURG (France)


  193. S. P. Tiwari, Subodh G. Mhaisalkar and V. Ramgopal Rao, "Ambipolar Organic Field Effect Transistors with semi conducting blends for CMOS-type Organic circuits", Proceedings of the European Materials Research Society (EMRS)Spring Meeting, MAY 28 to JUNE 1, 2007, Congress Center - STRASBOURG (France)


  194. Srinivas P, S.P. Tiwari, Tommy Cahyadi, S. G. Mhaisalkar and V. Ramgopal Rao, "A Simple and Direct Method for Interface Characterization of OFETs", Proceedings of the 14th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 11-13 July 2007, Bangalore, India


  195. C.R Manoj, N. Meenekshi and V.Ramgopal Rao, "Optimum Body Doping for Improving the Bulk FinFETs Performance", Proceedings of the 14th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 11-13 July 2007, Bangalore, India


  196. S. P. Tiwari, D. Maji, Srinivas P., Nitin S. Kale and V. Ramgopal Rao, "Patterned gate OFETs with inorganic High-K gate dielectric materials for all P-type Organic circuits", Proceedings of the European Materials Research Society (EMRS)Spring Meeting, MAY 28 to JUNE 1, 2007, Congress Center - STRASBOURG (France)


  197. Y. Kobayashi, K. Tsutsui, K. Kakushima, V. Hariharan, V. Ramgopal Rao, P. Ahmet and H. Iwai, "Parasitic Effects Depending on Shape of Spacer Region on FinFETs," Proceedings of the 211 th Meeting of the Electrochemical Society, Hilton Chicago, Chicago, Illinois, May 6-10, 2007


  198. Bulusu Anand, V. Ramgopal Rao and M. P. Desai, "Circuit Performance Improvement Using PDSOI-DTMOS Devices with a Novel Optimal Sizing Scheme Considering Body Parasitics", Proceedings of the 2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT) Hsinchu, Taiwan, April 25-27, 2007


  199. S. P. Tiwari, V. Ramgopal Rao, Huei Shaun Tan, E. B. Namdas and Subodh G Mhaisalkar, "Pentacene Organic Field Effect Transistors on Flexible substrates with polymer dielectrics", Proceedings of the 14 th International Symposium on VLSI Technology, Systems, and Applications (2007 VLSI-TSA), April 23-25, 2007 Hsinchu, Taiwan


  200. C. Sandhya, N. Mani Bharath and V Ramgopal Rao, "Back-interface Characterization of SOI MOSFETs using Transient Charge Pumping", Proceedings of the 37th IEEE Semiconductor Interface Specialists Conference (SISC), December 7-9, 2006, San Diego, USA


  201. Nitin S.Kale, Vamsi Krishna, R. Pinto, P. R. Apte, R. Lal, V. Ramgopal Rao, "Fabrication of Cantilever Structures for Bio-MEMS applications using Hotwire CVD Silicon Nitride", Proceedings of the 4th International Conference on Hot-Wire CVD (Cat-CVD) Process, Japan, October 4-8, 2006


  202. S. P. Tiwari, Srinivas P., Shriram S., Nitin S. Kale, Subodh Mhaisalkar and V. Ramgopal Rao, "Organic FETs with HWCVD Silicon Nitride as Passivating Layer and Gate Dielectric", Proceedings of the 4th International Conference on Hot-Wire CVD (Cat-CVD) Process, Japan, October 4-8, 2006


  203. Partha Sarkar, Abhijit Mallik, Chandan Kumar Sarkar and V. Ramgopal Rao, "The Effects of Varying Tilt Angle of Halo Implant on the Performance of Sub 100nm LAC MOSFETs", International Conference on Industrial and Information Systems, Srilanka, August 8-11, 2006


  204. M Joshi, N Kale, S Mukherji, R Lal, V Ramgopal Rao, "Affinity Cantilever Sensors for Cardiac Diagnostics", Indo Chinese Workshop on MEMS and Related Technologies, New Delhi, April 5-7, 2006 (Invited)


  205. K. Narasimhulu and V. Ramgopal Rao, "Analog Device and Circuit Performance Degradation under Substrate Enhanced Hot Carrier Stress Conditions", 44th Annual International Reliability Physics Symposium (IRPS), March 26-30, 2006, San Jose, California, USA


  206. Manoj C. R, Abhinav Mangal, V. Ramgopal Rao and Hiroshi Iwai,"Parasitic Effects in Multi-gate MOSFETs", International Workshop on Nano CMOS, Jan 30- Feb 1, 2006, Mishima, Shizuoka prefecture, Japan (Invited)


  207. K. Narasimhulu and V. Ramgopal Rao, "Analog Circuit Performance Issues with Aggressively Scaled Gate Oxide CMOS Technologies", Proceedings of the 19 th International Conference on VLSI Design, January 3-7, 2006, Hyderabad, India


  208. Partha Sarkar, A. Mallik, C. K. Sarkar and V. Ramgopal Rao, "Performance of Channel Engineered SDODEL MOSFET for Mixed Signal Applications", Proceedings of the 2005 IEEE International Conference on Electron Devices and Solid-State Circuits, Hong Kong, December 19-21, 2005


  209. M. V. Rammohan Reddy, D. K. Sharma, M. B. Patil and V.Ramgopal Rao, "Multigate FETs for sub 65nm CMOS Technologies- Implications for Circuit Design", 13 th International Workshop on The Physics of Semiconductor Devices (IWPSD), December 13-17, 2005, New Delhi (Invited)


  210. K. Narasimhulu, V. Ramgopal Rao, "Forward Body-biased Single Halo MOS Devices for Low Voltage Analog Circuits", Proceedings of the 2005 International Conference on Simulation of Semiconductor Processes and Devices, September 1-3, 2005, Tokyo, Japan


  211. A. Sathyapalan, A. Lohani, Sangita Santra, M. Ravikanth, S.Mukherji and V.Ramgopal Rao, "Meso-pyridyl Porphyrin Self-assembled Monolayers on Gold Substrates for Molecular Electronics Applications", Proceedings of the 5 th IEEE Conference on Nanotechnology, July 11-15,2005, Nagoya, Japan


  212. M. Joshi, R.Pinto, V. Ramgopal Rao and S.Mukherji, "Silanization and Antibody Immobilization on SU8", Proceedings of the 3rd International Conference on Materials for Advanced Technologies (ICMAT 2005), 3 - 8 July 2005, Singapore


  213. Neeraj K. Jha, P. Sahajananda Reddy and V. Ramgopal Rao, "A New Drain Voltage Enhanced NBTI Degradation Mechanism", Proceedings of the 2005 (43 rd Annual) International Reliability Physics Symposium (IRPS), April 17–21, 2005, San Jose, California, USA


  214. M. Joshi, S. Singh, B. Swain, S. Patil, R. Dusane, V. Ramgopal Rao and S.Mukherji, "Anhydrous silanization and antibody immobilization on hotwire CVD deposited silicon oxynitride films", Proceedings of the IEEE INDICON 2004, Dec. 20-22, 2004 Pages: 538-541


  215. K. Narasimhulu and V. Ramgopal Rao, "Understanding the Impact of Process Variations on Analog Circuit Performance with Halo Channel Doped Deep Sub-Micron CMOS Technologies", Proceedings of the 35th International Conference on Solid State Devices and Materials (SSDM 2004), Tokyo, Japan, September 15-17, 2004


  216. Pradeep Kumar Chawda, B. Anand and V.Ramgopal Rao, "Effectiveness of Optimum Body Bias for Leakage Reduction in High K CMOS Circuits", Proceedings of the 35 th International Conference on Solid State Devices and Materials (SSDM 2004), Tokyo, Japan, September 15-17, 2004


  217. M. Joshi, V. Ramgopl Rao and S. Mukherji, "AFM characterization and selectivity of immobilization of antibodies for Bio-MEMS applications", Proceedings of the International Bio-engineering Conference, September 8-10, 2004, Singapore


  218. Bhawna Tomar and V. Ramgopal Rao, "Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS Memories", Proceedings of the 11 th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, July 5-8, 2004 Hinshcu, Taiwan


  219. Neeraj Jha, V. Ramgopal Rao, "Understanding the NBTI Degradation in Halo- Doped Channel p-MOSFETs", Proceedings of the 11th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, July 5-8, 2004 Hinshcu, Taiwan


  220. K. Narasimhulu,Siva G.Narendra and V. Ramgopal Rao, "Effect of Process Variations on Device and Circuit Parameters with LAC/DH MOSFETs", Proceedings of the 17 th IEEE International Conference on VLSI Design, January 7-9, 2004, Mumbai, India


  221. A. Dixit and V. Ramgopal Rao, "A Novel Dynamic Threshold Operation Using Electrically Induced Junction MOSFET in the Deep sub-micrometer CMOS Regime", Proceedings of the 16th IEEE International Conference on VLSI Design, January 4-8, 2003,New Delhi,India.


  222. N. R Mohapatra, M. P. Desai and V. Ramgopal Rao, "Detailed Analysis of FIBL in MOS Transistors with High-K Gate Dielectrics", Proceedings of the 16th IEEE International Conference on VLSI Design, January 4-8, 2003, New Delhi, India


  223. D. Vinay Kumar, N. R.Mohapatra, V. Ramgopal Rao and M. B. Patil, "Application of the look-up table approach to high-K dielectric MOS transistor circuits," Proceedings of the 16th IEEE International Conference on VLSI Design, January 4-8, 2003, New Delhi, India


  224. Najeeb-ud-Din, V.Ramgopal Rao and J.Vasi, "Small Signal Characteristics of Thin Film Single Halo SOI MOSFETs for Mixed Mode Applications", Proceedings of the 16th IEEE International Conference on VLSI Design, January 4-8, 2003, New Delhi, India


  225. Nihar R. Mohapatra, S. Mahapatra, V. Ramgopal Rao, S. Shukuri and J. Bude, "Effect of Programming Biases on the Reliability of CHE and CHISEL Flash EEPROMs", Proceedings of the International Reliability Physics Symposium (IRPS) 2003, March 30-April 3, 2003, Dallas, Texas, USA


  226. Nihar Mohapatra, Deleep Nair, Souvik Mahapatra, V. Ramgopal Rao and Shoji Shukuri, "The Impact of Channel Engineering on the Performance Reliability and Scaling of CHISEL NOR Flash EEPROMs", 33rd European Solid-State Device Research Conference (ESSDERC) 2003: 16 - 18 September 2003, Pages: 541-544, Lisbon, Portugal


  227. K. N. Manjularani, V. Ramgopal Rao, J. Vasi, "Relaibility of Ultrathin JVD Silicon Nitride MNSFETs under High Field Stressing", Proceedings of the 10 th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, 7-11 July 2003, Singapore


  228. Najeeb-ud-Din, V. Ramgopal Rao and J. Vasi, "Thin Film Single Halo (SH) SOI nMOSFETs - Hot Carrier Reliability for Mixed Mode Applications", IEEE TENCON 2003, Convergent Technologies for the Asia-Pacific, October 14-17, 2003,Bangalore, India


  229. K. N. Manjularani, V.Ramgopal Rao and J.Vasi, "Characterization of High-Field Stress-Induced Border Traps in JVD Si3N4 Transistors by Drain urrent Transient and 1/f Methods", 34th IEEE Semiconductor Interface Specialists Conference (SISC), December 4-6, 2003, Washington, D.C., USA


  230. Najeeb-ud-Din, Aatish Kumar, Mohan V. Dunga, V. Ramgopal Rao, J. Vasi, "Suppression of Parasitic BJT Action in Single Pocket Thin Film Deep Sub-micron SOI MOSFETs", Proceedings of the 2002 MRS Spring Meeting, San Francisco, California (April 1-5, 2002)


  231. Nihar R. Mohapatra, M. P. Desai, V. Ramgopal Rao, "Effect of Technology Scaling on MOS Transistors with High-K Gate Dielectrics", Proceedings of the 2002 MRS Spring Meeting, San Francisco, California (April 1-5, 2002)


  232. Krishna K. Bhuwalka, Nihar R. Mohapatra, Siva G. Narendra and V. Ramgopal Rao, "Effective dielectric thickness Scaling for High-K Gate Dielectric MOSFETs", Proceedings of the 2002 MRS Spring Meeting, San Francisco, California (April 1-5, 2002)


  233. P.C.Waghmare, S.B.Patil, A.Kumbhar, R.O.Dusane and V.Ramgopal Rao, "Improvement of Gate Dielectric Quality of MNS Capacitors by Hydrogen Etching for Ultra Thin Gate Dielectrics", Proceedings of the 2002 MRS Spring Meeting, San Francisco, California (April 1-5, 2002)


  234. K. N. ManjulaRani, V. Ramgopal Rao and J. Vasi, "Degradation Study of Ultra-Thin JVD Silicon Nitride MNSFET", Proceedings of the 2002 MRS Spring Meeting, San Francisco, California (April 1-5, 2002)


  235. Nihar. R. Mohapatra, Souvik Mahapatra and V. Ramgopal Rao, "Device Scaling Effects on Substrate Enhanced Degradation in MOS Transistors", Proceedings of the 2002 MRS Spring Meeting, San Francisco, California (April 1-5, 2002)


  236. A.Dixit, R. O. Dusane and V.Ramgopal Rao, "Electrically Induced Junction MOSFET for High Performance Sub 50 nm CMOS Technology", Proceedings of the 2002 MRS Spring Meeting, San Francisco, California (April 1-5, 2002)


  237. Yatin Mutha, K. N. ManjulaRani, R. Lal and V. Ramgopal Rao, "Polarity Dependence of Degradation in Ultra Thin Oxide and JVD Nitride Gate Dielectrics", Proceedings of the 2002 MRS Spring Meeting, San Francisco, California (April 1-5, 2002)


  238. A. V. Vairagar, S. B. Patil, D. J. Pete, R. O. Dusane, N. Venkatramani and V.Ramgopal Rao, "Suppression of Boron Penetration by Hot Wire CVD Polysilicon", Proceedings of the 9 th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, 8-12 July 2002, Singapore


  239. N. R. Mohapatra, S. Mahapatra and V. Ramgopal Rao, "Bias and Time Dependene of Damage Generation in n-Channel MOS Transistors Operating in the Substrate Enhanced Gate Current Regime", Proceedings of the 9 th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, 8-12 July 2002, Singapore


  240. Yatin M. Mutha, R. Lal and V. Ramgopal Rao, "Physical Mechanisms for Pulsed AC Stress Degradation in Thin Gate Oxide MOSFETs", Proceedings of the 9 th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, 8-12 July 2002,Singapore.


  241. Neeraj K. Jha, M. Shojaei and V. Ramgopal Rao, "Performance and Reliability of Single Pocket Deep Submicron MOSFETs for Analog Applications", Proceedings of the 9 th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, 8-12 July 2002, Singapore


  242. Neeraj K. Jha, V. Ramgopal Rao and J. C. S. Woo, "Optimization of Single Halo p-MOSFET Implant Parameters for Improved Analog Performance and Reliability", Proceedings of the 32 nd European Solid-State Device Research Conference (ESSDERC), 24-26 September 2002, Florence, Italy


  243. Parag C. Waghmare, Samadhan B. Patil, Alka A. Kumbhar, Laxmi Sahoo, V. Ramgopal Rao and R.O. Dusane, "Nitrogen dilution effects on structural and electrical properties of hot wire deposited a-SiN:H films for Deep Sub-micron CMOS Technologies", Proceedings of the International Conference on Cat-CVD (Hot-Wire CVD) Process, Denver, CO, USA, September 10-13, 2002


  244. Samadhan B. Patil, Anand V. Vairagar, Alka A. Kumbhar, Laxmi K. Sahu, V. Ramgopal Rao, N. Venkatramani, R. O. Dusane and B. Schroeder, "Highly Conducting P+- PolySi Deposited by HWCVD and its Applicability As Gate Material for CMOS Devices", Proceedings of the International Conference on Cat-CVD (Hot-Wire CVD) Process, Denver, CO, USA, September 10-13, 2002


  245. D. Vinay Kumar, R. A. Thakker, M. B. Patil and V. Ramgopal Rao, "Simulation study of non quasi static behaviour of MOS transistors", Proc. 5th International Conference on Modeling and Simulation of Microsystems, San Juan, Puerto Rico, April 22, 2002


  246. P. Poornima, S. K. Tripathy, V. Ramgopal Rao and D. K. Sharma, "Resolution Enhancement Techniques for Optical Lithography", Proceedings of the 11 th International Workshop on The Physics of Semiconductor Devices, December 11-15, 2001, Delhi, India (Invited)


  247. Najeeb-ud-Din, V. Ramgopal Rao and J. Vasi, "Characterization and simulation of Lateral Asymmetric Channel Silicon-on-Insulator MOSFETs", Proceedings of the 11 th International Workshop on The Physics of Semiconductor Devices, December 11-15, 2001, Delhi, India


  248. K. N. ManjulaRani, V. Ramgopal Rao and J. Vasi, "High Field Stressing Effects in JVD Nitride Capacitors", Proceedings of the 11 th International Workshop on The Physics of Semiconductor Devices, December 11-15, 2001, Delhi, India


  249. A. Dixit, D. K. Pal, J. N. Roy and V. Ramgopal Rao, "Channel Engineering for Sub-micron CMOS Technologies", Proceedings of the 11 th International Workshop on The Physics of Semiconductor Devices, December 11-15, 2001, Delhi, India


  250. D. Vinay Kumar, M. B. Patil, N. R. Mohapatra, V. Ramgopal Rao, B. Anand and M. P. Desai, "A new look-up table circuit simulator", Proc. Chandigarh Symp. on Microelectronics, Punjab University, February, 2001 (Invited)


  251. Mohan V. Dunga, Aatish Kumar and V. Ramgopal Rao, "Analysis of Floating Body Effects in Thin Film SOI MOSFETs using the GIDL Current Technique", Proceedings of 8 th IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits, 9-13 July 2001, Singapore


  252. Nihar Mohapatra, M. P. Desai, Narendra Siva and V. Ramgopal Rao, "The Impact of High-K Gate Dielectrics on Sub 100nm CMOS Circuit Performance", Proceedings of the 31 st European Solid-State Device Research Conference (ESSDERC), 11-13 September 2001, Nuremberg, Germany, September, 2001.


  253. Nihar Mohapatra, Souvik Mahapatra and V. Ramgopal Rao, "Study of Degradation in Channel Initiated Secondary Electron Injection Regime", Proceedings of the 31 st European Solid-State Device Research Conference (ESSDERC), 11-13 September 2001, Nuremberg, Germany, September, 2001.


  254. Aatish Kumar, Rakesh Lal and V. Ramgopal Rao, "A Simple and Direct Technique for Interface Characterization of SOI-MOSFETs and its Application in Sub 100nm JVD-MNSFETs", 12 th Bi-annual conference on Insulating Films on Semiconductors, INFOS, June 20-23, 2001, Italy


  255. Parag C. W, Samadhan Patil, Alka Kumbhar, R. O. Dusane, V. Ramgopal Rao, "Ultra thin Silicon Nitride by Hot Wire CVD for Deep Sub-Micron CMOS Technologies", Proceedings of the Micro and Nanoengineering (MNE'01) Conference, September 16-19, 2001,France


  256. Najeebuddin, Aatish Kumar, Mohan V. Dunga, V. Ramgopal Rao and J. Vasi, "Characterization of Lateral Asymmetric Channel (LAC) Thin Film SOI MOSFETs", 6 th International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Shanghai, China, 22-25 th October, 2001 (Invited)


  257. P. C. Waghmare, S. B. Patil, A. Kumbhar, R. O. Dusane and V. Ramgopal Rao, "Reliability Issues of Ultra Thin Silicon Nitride by Hot-Wire CVD for Deep Sub-Micron CMOS Technologies", Proceedings of the 11 th International Workshop on The Physics of Semiconductor Devices, December 11-15, 2001, Delhi, India


  258. Mayank Gupta, V. Vidya, V. Ramgopal Rao, Kun H. To, Jason C. S. Woo, "Optimization of Sub 100 nm Gamma-Gate Si-MOSFETs for RF Applications", Proceedings of the 11 th International Workshop on The Physics of Semiconductor Devices, December 11-15, 2001, Delhi, India


  259. Nihar. R. Mohapatra, Souvik Mahapatra and V. Ramgopal Rao, "A Comparative Study of Degradation for NMOSFET's in CHE and CHISEL Injection Regime", Proceedings of the 11 th International Workshop on The Physics of Semiconductor Devices, December 11-15, 2001, Delhi, India


  260. K. N. Manjularani, V. Ramgopal Rao and J. Vasi, "Border Trap Generation in JVD Nitride Capacitors Under High Field Stressing", 31 st IEEE Semiconductor Interface Specialists Conference, November 28 - December 1, 2001, Washington D.C, USA


  261. G. Shrivastav, S. Mahapatra, V. Ramgopal Rao, J. Vasi, K. G. Anil, C. Fink, W. Hansch and I. Eisele, "Performance Optimization of 60 nm Channel Length Vertical MOSFETs Using Channel Engineering", Proceedings of the 14th International Conference on VLSI Design, January 2001, Bangalore, INDIA


  262. Nihar R. Mohapatra, A. Dutta, M. P. Desai and V. Ramgopal Rao, "Effect of Fringing Capacitances in Sub 100 nm MOSFET's with High-K Gate Dielectrics", Proceedings of the 14th International Conference on VLSI Design, January 2001, Bangalore, INDIA


  263. N. Mahapatra, M. P. Desai and V. Ramgopal Rao, "Device and Circuit Performance Issues with High-K Gate Dielectrics", Proceedings of the National seminar on VLSI: Systems, Design and Technology, IIT Bombay, Dec 2000.


  264. Samadhan B. Patil, A. Kumbhar, P. Waghmare, V. Ramgopal Rao and R. O. Dusane, "Low Temperatue Silicon Nitride deposited by Cat CVD for Deep Sub-micron CMOS Devices", Proceedings of the International Conference on Cat-CVD (Hot-Wire CVD) Process, Kanazawa, Japan, November 2000


  265. Nihar R. Mohapatra, A. Dutta, G. Sridhar, M. P. Desai and V. Ramgopal Rao, "Sub 100 nm CMOS Circuit Performance with High-K Gate Dielectrics", Proceedings of the 11th Workshop on Dielectrics in Microelectronics (WoDiM), November 13-15, 2000, Munich, Germany


  266. Aatish Kumar, Souvik Mahapatra, Rakesh Lal and V. Ramgopal Rao, "Multi-Frequency Transconductance Technique for Interface Characterization of Deep Sub-Micron SOI-MOSFETs", Proceedings of the 11th Workshop on Dielectrics in Microelectronics (WoDiM), November 2000, Munich, Germany


  267. K. G. Anil, S. Mahapatra, I. Eisele, V. Ramgopal Rao and J. Vasi, "Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime", Proceedings of the 30 th European Solid-State Device Research Conference (ESSDERC), Ireland, September, 2000


  268. K. G. Anil, S. Mahapatra, V. Ramgopal Rao and I. Eisele, "Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs", Proceedings of the International Conference on Solid state Devices and Materials (SSDM) Sendai, Japan, August 28-31, 2000


  269. S. Mahapatra, V. Ramgopal Rao, J. Vasi, B. Cheng and J. C. S. Woo, "Reliability Studies on Sub 100 nm SOI-MNSFETs", Proceedings of the International Integrated Reliability Workshop, October 23-26, 2000, California, USA.


  270. V. Ramgopal Rao, S. Mahapatra, J. Vasi, K. G. Anil, C. Fink, W. Hansch and I. Eisele, "Hot-Carrier Performance of 60 nm Channel Length Delta-Doped Vertical MOSFETs with High-pressure Grown Oxide as a Gate Dielectric", Proceedings of the 30th IEEE Semiconductor Interface Specialists Conference, 2000, San Diego, California, USA


  271. Samadhan B. Patil , Sangeeta Vaidya, Alka Kumbhar, R. O. Dusane, A. N. Chandorkar and V. Ramgopal Rao, "Low Temperature Hot-Wire CVD Nitrides for Deep Sub-Micron CMOS Technologies", Proceedings of the SPIE - The International Society for Optical Engineering, vol.3975, pt.1-2, (Tenth International Workshop on the Physics of Semiconductor Devices, New Delhi, India, 14-18 Dec.1999.) SPIE-Int. Soc. Opt. Eng, 2000. Pages: 879-82


  272. M. Hemkar, J. Vasi, V. Ramgopal Rao, B. Cheng, J. C. S. Woo, "Optimization and realization of sub 100 nm channel length lateral asymmetric channel p-MOSFETS", Proceedings of the SPIE - The International Society for Optical Engineering, vol.3975, pt.1-2, (Tenth International Workshop on the Physics of Semiconductor Devices, New Delhi, India, 14-18 Dec. 1999.) SPIE-Int. Soc. Opt. Eng, 2000. Pages: 584-7.


  273. Sharad Sharma and V. Ramgopal Rao, "Performance Trade-offs by the Use of High-K Gate Dielectrics in Sub 100 nm CMOS Technologies", Proceedings of the SPIE - The International Society for Optical Engineering, vol.3975, pt.1-2, (Tenth International Workshop on the Physics of Semiconductor Devices, New Delhi, India, 14-18 Dec. 1999.) SPIE-Int. Soc. Opt. Eng, 2000. Pages: 896-9


  274. Sushant S. Suryagandh and V. Ramgopal Rao, "Dynamic Threshold Voltage MOSFETs for Future Low Power Sub 1V CMOS Applications", Proceedings of the SPIE - The International Society for Optical Engineering, vol.3975, pt.1-2, (Tenth International Workshop on the Physics of Semiconductor Devices, New Delhi, India, 14-18 Dec. 1999.) SPIE-Int. Soc. Opt. Eng, 2000. Pages: 655-8


  275. S. Mahapatra, K. N. Manjularani, V. Ramgopal Rao and J. Vasi, "ULSI MOS Transistors with Jet Vapour Deposited (JVD) Silicon Nitride for the Gate Insulator", Proceedings of the SPIE - The International Society for Optical Engineering, vol.3975, pt.1-2, (Tenth International Workshop on the Physics of Semiconductor Devices, New Delhi, India, 14-18 Dec. 1999.) SPIE-Int. Soc. Opt. Eng, 2000. Pages: 803-10


  276. C. R. Viswanathan, V. Ramgopal Rao and T. Brozek, "Localized Charge Injection-A Tool to Investigate Plasma Damage in CMOS Devices", (invited) Proceedings of the 9 th International Conference on Physics of Semiconductor Devices, December, 1997, New Delhi, India


  277. S. Mahapatra, V. Ramgopal Rao, C. D. Parikh, J. Vasi, B. Cheng and J. C. S.Woo, "Hot-Carrier Induced interface Trap Distributions in Conventional and Asymmetric Channel MOSFETs as Determined by a novel Charge Pumping Technique", Presented at the 30 th Semiconductor Interface Specialists Conference (SISC), South Carolina, USA, December 1999


  278. S. Mahapatra, V. Ramgopal Rao, C. D. Parikh, J. Vasi, B. Cheng and J. C. S. Woo, "A Study of 100 nm Channel Length Asymmetric MOSFETs by Using Charge Pumping", Proceedings of the Insulating Films on Semiconductors (INFOS), June 1999, Kloster Banz,Germany.


  279. S. Mahapatra, V. Ramgopal Rao, K. N. Manjularani, C. D. Parikh, J. Vasi, B. Cheng, M. Khare and J. C. S. Woo, "100 nm Channel Length MNSFETs using a Jet Vapor Deposited Ultra-thin Silicon Nitride Gate Dielectric", Technical Digest, 1999 Symposium on VLSI Technology, June 14-19, Kyoto, Japan


  280. B. Cheng, A. Inani, V. Ramgopal Rao and J. C. S. Woo, "Channel Engineering for High Speed Sub-1.0 V Power Supply Deep Sub-Micron CMOS", Technical Digest, 1999 Symposium on VLSI Technology, June 14-19, Kyoto, Japan


  281. S. Mahapatra, V. Ramgopal Rao, C. D. Parikh, J. Vasi, B. Cheng, M. Khare and J. C. S. Woo , "Hot-Carrier Induced Interface Degradation in Jet Vapor Deposited SiN MNSFETs as Studied by a Novel Charge Pumping Technique", Pages: 592-595, 29 th European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium 13 - 15 September,1999.


  282. A. Inani, V. Ramgopal Rao, B. Cheng, P. Zeitzoff and J. C. S. Woo, "Capacitance Degradation due to Fringing Fields in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics", Pages: 160-163, 29 th European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium 13-15 September, 1999


  283. V. Ramgopal Rao, W. Hansch, S. Mahaptra, D. K. Sharma, J. Vasi, T. Grabolla and I. Eisele, "Low Temperature-High Pressure Grown Thin Gate Dielectrics for MOS Applications", Proceedings of the Insulating Films on Semiconductors (INFOS), June 1999, Kloster Banz,Germany


  284. V. Ramgopal Rao, I. Eisele and T. Grabolla, "Alternative Gate Insulators for Future Deep Submicron Channel Length MOSFETs", Proc. of VIII International Conference on Physics of Semiconductor Devices, December, 1995, New Delhi, India


  285. A. Mallik, V. Ramgopal Rao, A. N. Chandorkar and J. Vasi, "Trap generation upon irradiation in reoxidised nitrided oxide gate dielectrics", Proc. of VII International conference on Physics of Semiconductor Devices, December, 1993 New Delhi, India


  286. V. Ramgopal Rao, G. Wijeratne, D. Chu, T. Brozek and C. R. Viswanathan, "Plasma Process Induced Abnormal 1/f Noise Behavior in Deep Sub-Micron MOSFETs", 3 rd International Symposium on Plasma Process-Induced Damage (P2ID), Hawaii, USA, June,1998


  287. W. Hansch, A. Nakajima, K. Shibahara, V. Ramgopal Rao and I. Eisele, "Observation of Periodic Current Oscillations in Vertical sub-100nm MOS-PDBFETs with Wide Channels", 1998 IEEE Silicon Nanoelectronics workshop, (Satellite Workshop, VLSI T.echnology Symposium) Honolulu, Hawaii, USA, June, 1998


  288. C. R. Viswanathan and V. Ramgopal Rao, "Application of charge pumping technique for sub-micron MOSFET characterization", Presented at the Electrical and Physical Characterization of Materials and Devices for Silicon Microelectronics. MIGAS, Autrans, France, 29 June-5 July 1998


  289. A. Inani, B. Cheng, V. Ramgopal Rao and J. C. S. Woo, "Gate Stack Architecture Analysis in sub 100 nm Channel Length MOSFETs", 5 th National SRC Conference TECHCON, 1998, Las Vegas, USA


  290. B. Cheng, V. Ramgopal Rao, B. Ikegami and J. C. S.Woo, "Realization of sub 100 nm asymmetric Channel MOSFETs with Excellent Short-Channel Performance and Reliability", Technical Digest, 28 th European Solid-State Device Research Conference (ESSDERC), Bordeaux, France, 1998


  291. R. Sachdev, G. Wijeratne, V. Ramgopal Rao and C. R. Viswanathan, "A study of the effect of Plasma Damage on Sub-micron MOSFET’s Flicker Noise Properties", Technical Digest, 28th European Solid-State Device Research Conference (ESSDERC), Bordeaux, France,1998.


  292. A. Inani, V. Ramgopal Rao, B. Cheng, M. Cao, P. V. Voorde, W. Greene and J. C. S. Woo, "Performance Considerations in Using High-k Dielectrics for Deep Sub-Micron MOSFETs", Proceedings of the Solid state Devices and Materials (SSDM) Research Conference, Hiroshima, Japan, 7-10 Sept., 1998


  293. B. Cheng, V. Ramgopal Rao, and J. C. S. Woo, "Sub 0.18 um SOI MOSFETs Using Lateral Asymmetric Channel Profile and Ge Pre-amorphization Salicide Technology", Proceedings of the IEEE SOI Conference, October 5-8, Stuart, Florida, USA, 1998


  294. W. Hansch, V. Ramgopal Rao and I. Eisele, "The Planar-Doped-Barrier FET:MOSFET Overcomes Conventional Limitations", Technical Digest, Page: 624, 27 th European Solid-State Device Research Conference (ESSDERC), Stuttgart, Germany, September, 1997


  295. W. Hansch, F. Kaesen, V.Ramgopal Rao and I. Eisele, "Electric field-tailoring in MBE-grown MOSFETs", Technical Digest, Page: 117, 7th International Symposium on Silicon Molecular Beam Epitaxy, Banff, Canada, July 1997


  296. V. Ramgopal Rao, W. Hansch, H. Baumgartner, I. Eisele, D. K. Sharma, J. Vasi and T. Grabolla, "Charge Trapping Behavior in Deposited and Grown Thin MOS Gate Dielectrics", Proceedings of the European Materials Research Society (EMRS) Symposium, 1996 Spring Meeting, Strasbourg, France


  297. Anand Sridharan, V. Ramgopal Rao, Tomasz Brozek, J. Werking and C. R. Viswanathan, "Charge Injection using Gate-Induced-Drain-Leakage Current for Characterization of Plasma Edge Damage in CMOS Devices", Technical Digest, Page: 560, 27 th European Solid-State Device Research Conference (ESSDERC), Stuttgart, Germany, September, 1997


  298. V. Ramgopal Rao, W. Hansch and I. Eisele, "Simulation, Fabrication and Characterization of High Performance Planar-Doped-Barrier Sub 100 nm Channel MOSFETs", Technical Digest, IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), Pages: 811-814, Washington DC, USA, December, 1997

NATIONAL CONFERENCE PROCEEDINGS

  1. Anita Topkar, Praveenkumar S., Bharti Aggarwal, V. Ramgopal Rao and P. K. Mukhopadhyay, "Development of 'XRFET' Dosimeters for Integrated Ionizing Radiation Measurements", DAE-BRNS National Symposium on Nuclear Instrumentation, Mumbai, India.


  2. Angada B. Sachid, M. S. Baghini, Dinesh K. Sharma and V. Ramgopal Rao, "Technology Aware Design using FinFETs at Sub-22 nm End-of-CMOS Roadmap Logic and Memory Applications", The 15th International Workshop on the Physics of Semiconductor Devices (IWPSD), December 15-19, 2009, Delhi (Invited)


  3. Ashish Pal, Ram Asra, Angada B. Sachid, Harald Gossner and V. Ramgopal Rao, "Ultra-Low Power CMOS Device Design and Optimization for Sub-0.5V Supply Voltage Applications", The 15th International Workshop on the Physics of Semiconductor Devices (IWPSD), December 15-19, 2009, Delhi (Invited)


  4. Mayank Shrivastava, Harald Gossner, M. S. Baghini and V. Ramgopal Rao, "Reliability aware I/O Design for Sub 45 nm Node CMOS Technologies", The 15th International Workshop on the Physics of Semiconductor Devices (IWPSD), December 15-19, 2009, Delhi (Invited)


  5. Manoj Joshi, Nitin Kale, Sheetal Patil, Harshal Rokade, Soumyo Mukherji, R. Pinto, P. R. Apte, Rakesh Lal and V. Ramgopal Rao, "Affinity Cantilever sensors for Myocardial Infarction", International Microelectronics and Packaging Society (IMAPS) India National Conference, Dec 20-21, 2005, Mumbai


  6. M. V. Rammohan Reddy, D. Vinay Kumar, D. K. Sharma, M. B. Patil and V. Ramgopal Rao, "FinFET based Low Power Gilbert Cell Mixer", International Microelectronics and Packaging Society (IMAPS) India National Conference, Dec 20-21, 2005, Mumbai


  7. Seena V., Mahendra K. Jain, V. Ramgopal Rao, S. Praveenkumar and Anita Topkar, "ONO based Triple dielectric passive dosimeters", DAE-BARC National Symposium on Compact Nuclear instruments and Radiation Detectors, March 2-4, 2005, Jodhpur, India


  8. V. Ramgopal Rao and K. Narasimhulu, "CMOS Device Design and Optimization for System-on-Chip Applications", Emerging Trends in Electronics (Electro -2005), February, 03-05, 2005, Banaras Hindu University, Varanasi (Invited)


  9. V. Ramgopal Rao and K. Narasimhulu, "Novel Device Architectures and Processes for the 65 nm CMOS Technology Node and Beyond", Indian National Academy of Engineering (INAE) Conference on Nanotechnology (ICON-2003), Dec. 22-23, 2003, Chandigarh, India (Invited)

(SELECTED) TECHNICAL REPORTS:

  1. V. Ramgopal Rao, "MOS Noise/Device Characterization for Mixed Signal Applications" Department of Science and Technology, Govt. of India, 2006


  2. R. Lal, V. Ramgopal Rao, S.Mukherji and et al., "Biosensors for Cardiac Applications", National Programme on Smart Materials (NPSM), ADA, India, 2006


  3. Vijay Mishra, Pourus Mehta, S. K. Kataria and V. Ramgopal Rao, "Development of Silicon Drift Detectors with Integrated Front End Electronics", Design Basis Report, BARC, Mumbai, 2004


  4. V. Ramgopal Rao, "Channel engineering for Sub 100 nm MOSFETs", Department of Science and Technology, Govt. of India, 2003


  5. C. R. Viswanathan and V. Ramgopal Rao, "Plasma Damage Studies Using SPIDER Structures", Microelectronic Innovation and Computer Research Opportunities (MICRO), University of California, 1998


  6. V. Ramgopal Rao, "Radiation Induced Interface State Generation in Nitrided and Reoxidized Nitrided Gate Oxides" Department of Electronics, MHRD, Govt. of India 1992

Email id : rrao@ee.iitb.ac.in
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