Keynote Speakers

Prof. Subhasish Mitra ProfMira
Department of Electrical Engineering
and Department of Computer Science,
Stanford University
Title: The Next Big Thing in Test
Mr. Friedrich Hapke MrHapke
Director of Engineering Germany,
at Mentor Graphics Silicon
Test Solution Division
Title: Cell-Aware Test and Diagnosis
Mr. Harry Chen MrChen
Chair of MediaTek's Design Technology
R&D Lab
Title: Adaptive System-Level Test for High-Volume Mobile Phone Chips
Prof. Masahiro Fujita ProfFujita
VLSI Design and Education Center,
The University of Tokyo
Title: Unified logic framework for synthesis, testing and diagnosis