Mr. Harry Chen
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Chair of MediaTek's Design Technology R&D Lab
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Title: Adaptive System-Level Test for High-Volume Mobile Phone Chips
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Abstract: The market for mobile phone chips is characterized by high volume, fast
time-to-market, and short product lifetimes. To ensure high quality, system-level test
(SLT) is used during volume ramp-up to supplement production test. On the downside
however, SLT incurs extra cost and impedes high-volume throughput. One way to
address the negatives of SLT is to limit its application to only those chips that have
higher risk of failing in the system. This talk will describe data analytics used during
wafer chip probe (CP) and package final test (FT) to identify such suspect chips. By
skipping SLT for “healthy” or non-suspect chips, we can realize SLT cost savings while
delivering quality products to meet volume demand.
Biography:
Harry Chen is currently the Chair of MediaTek's Design Technology R&D Lab. In his
close to 30 years of involvement in the semiconductor industry, Harry has worked on
design and test automation at Cadence, and mobile baseband chip integration at
Analog Devices. His research interests are in defect modeling and applying data
analytics toward test cost reduction and improving the quality of complex system-onchip
products. Harry received undergraduate and graduate degrees in electrical
engineering from MIT and Stanford University respectively.