Mr. Friedrich Hapke | |
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Director of Engineering Germany Mentor Graphics Silicon Test Solution Division |
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Title: Cell-Aware Test and Diagnosis | |
Biography:
Friedrich Hapke received the Diploma in electrical engineering from the University
of Applied Sciences, Hamburg, Germany. He is the Director of Engineering Germany, at
Mentor Graphics Silicon Test Solution Division. His primary focus is in research and
development of new methods and tools for supporting defectoriented cell-aware
testing, IEEE P1687, logic BIST, boundary-scan, and cell-internal failure diagnosis. His
interests also include electronic design automation in general for deep-submicron
technologies. Before joining Mentor Graphics, he held various research and
development management positions at NXP and Philips Semiconductors. He has
authored and co-authored several publications and holds over 20 patents in the area
of design for test. His recent publications have been on the topic of defect-oriented
cell-aware testing at the International Symposium on VLSI Design Automation and
Test, 2011, in Taiwan, at the Design Automation and Test in Europe, 2012, in Dresden,
Germany, at the European Test Symposium, 2012 in Annecy, France, at the
International Test Conference, 2012, in Anaheim, CA, USA, at the European Test
Symposium 2013, in Avignon, France, and at the International Symposium for Testing
and Failure Analysis, 2013, in San Jose, CA, USA.