Prof. Subhasish Mitra | |
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Department of Electrical Engineering and Department of Computer Science, Stanford University |
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Title: The Next Big Thing in Test | |
Biography:
Professor Subhasish Mitra directs the Robust Systems Group in the Department of
Electrical Engineering and the Department of Computer Science of Stanford University,
where he is the Chambers Faculty Scholar of Engineering. Before joining Stanford, he
was a Principal Engineer at Intel.
Prof. Mitra's research interests include robust systems, VLSI design, CAD, validation
and test, emerging nanotechnologies, and emerging neuroscience applications. His XCompact
technique for test compression has been key to cost-effective manufacturing
and high-quality testing of a vast majority of electronic systems, including numerous
Intel products. X-Compact and its derivatives have been implemented in widely-used
commercial Electronic Design Automation tools. His work on carbon nanotube
imperfection-immune digital VLSI, jointly with his students and collaborators, resulted
in the demonstration of the first carbon nanotube computer, and it was featured on
the cover of NATURE. The NSF presented this work as a Research Highlight to the US
Congress, and it also was highlighted as "an important, scientific breakthrough" by the
BBC, Economist, EE Times, IEEE Spectrum, MIT Technology Review, National Public
Radio, New York Times, Scientific American, Time, Wall Street Journal, Washington Post,
and numerous other organizations worldwide.
Prof. Mitra's honors include the Presidential Early Career Award for Scientists and
Engineers from the White House, the highest US honor for early-career outstanding
scientists and engineers, ACM SIGDA/IEEE CEDA A. Richard Newton Technical Impact
Award in Electronic Design Automation, "a test of time honor" for an outstanding
technical contribution, Semiconductor Research Corporation's Technical Excellence
Award, and the Intel Achievement Award, Intel’s highest corporate honor. He and his
students published several award-winning papers at major venues: IEEE/ACM Design
Automation Conference, IEEE International Solid-State Circuits Conference, IEEE
International Test Conference, IEEE Transactions on CAD, IEEE VLSI Test Symposium,
Intel Design and Test Technology Conference, and the Symposium on VLSI
Technology. At Stanford, he has been honored several times by graduating seniors "for
being important to them during their time at Stanford."
Prof. Mitra has served on numerous conference committees and journal editorial
boards. He served on DARPA's Information Science and Technology Board as an invited
member. He is a Fellow of the ACM and the IEEE.