Welcome to Asian Test Week
The purpose of this workshop is to bring researchers and practitioners on VLSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing. The sixteenth workshop on RTL and high level testing (WRTLT'15) will be held in conjunction with the 24th Asian Test Symposium (ATS'15). The workshop aims to encourage the presentation and discussion of truly innovative and ''out-of-the-box'' ideas aimed at addressing the challenges of high level test. We hope the workshop will provide an ideal forum for future complex system test at higher level of abstraction.
The conference opens the Call for papers here.