Department of Electrical Engineering
Indian Institute of Technology Bombay
The department is actively engaged in research areas ranging from practical implementation to theoretical investigations. Much of this research is funded by national and international funding agencies, both government and corporate. The research is published in leading international journals and conferences.
The Electrical Engineering Department is one of the largest departments in the institute and also in the country. Currently there are about 1100 students enrolled in various academic programs, about 200 project employees in various sponsored projects, about 30 technical staff, 30 administrative staff and about 60 faculty members. In addition, many prominent researchers/teachers across the world hold visiting appointments in the department.
The department, through the Electrical Engineering Students Association EESA, maintains regular contact with its alumni, many of whom are well-known and established in their careers across the world.
IITB Calendar directs you to the IITB academic calendar containing information about the academic activities such as orientation and registration of the new and already enrolled students, semester exams, vacation, dessertation and annual progress seminar details and details of other important events of the ongoing year.
Timetable directs you the course timetable and exam timetable.
Seminar and Events direct you to the list of recently held seminars and events respectively at Electrical Department, IITB.
The Department of Electrical Engineering (EE) is one of the major Departments of IIT Bombay since its inception in 1958. The department is very active in teaching and research in the areas of Communications and Signal Processing, Control and Computing, Power Electronics and Power Systems, Microelectronics and VLSI design, and Electronic Systems.
ADVANCED CMOS LOGIC AND FLASH MEMORY DEVICES
Basics of MOSFET operation (Mechanisms for Drain, Substrate and Gate current)
Conventional and non-conventional MOSFET scaling - innovations in materials for gate stack, channel and junctions, and architecture, processes for FinFETs and Gate All Around Nanosheet FETs
Introduction to Flash memory NOR/NAND architecture, Floating Gate/Charge Trap, Mirror Bit
Basics of Flash memory operation: Program, Erase, Program/Read Disturbs, Retention
Innovations in Flash Memory scaling, 2D and 3D NAND, Floating Gate and Charge Trap Flash
Reliability of logic and memory devices (theory, measurements and modeling) – BTI, HCD, TDDB in logic, P/E cycling, Data retention, Disturbs in memory
Taur and Ning, Fundamentals of Modern VLSI Devices, Cambridge Univ. Press, 2009
Cappelletti, Golla, Olivo and Zanoni, Flash Memories, Springer, 1999
Micheloni, Crippa and Marelli, Inside NAND Flash Memories, Springer, 2010
Mahapatra, Fundamentals of Bias Temperature Instability in MOS Transistors, Springer, 2016
Grasser, Hot Carrier Degradation in Semiconductor Devices, Springer, 2015
IEEE Xplore for review papers
IEEE Xplore for latest research papers
© Department of Electrical Engineering
Students' Reading Group