Department of Electrical Engineering, Indian Institute of Technology Bombay
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CMOS Transistors - Operation, Scaling, Reliability, and the Way Forward
Prof. Souvik, Mahapatra, Department of Electrical Engineering, IIT Bombay
Venue, Date and Time

GG-Conference Room, Electrical Engineering, Feb 08, 2017, 03:00 PM
Abstract

Complementary Metal Oxide Semiconductor (CMOS) transistors are ubiquitous in all Integrated Circuit (IC) chips that are used in modern day products like computers and mobile phones. From the early days, tremendous progress has been made by the semiconductor industry to develop this technology, which has enabled billions of transistors in a typical IC chip having the size of a small postage stamp. This has resulted in powerful products and applications that were unthinkable even a few years back (Internet Search, Social Media, Chats, Virtual Reality, to name a few), and has influenced the life of almost all of us in the planet earth. In this talk, I will cover the following topics: (i) CMOS transistor operation and conventional scaling, (ii) alternative scaling - innovations in materials and structures, and (iii) reliability - transistor ageing and breakdown. The talk will be accessible to undergraduate students in electronics, electrical engineering, physics, and materials science. I will also discuss about research opportunities at IIT Bombay in the area of semiconductor devices.
About the Speaker

Souvik Mahapatra received his PhD from IIT Bombay, India in 1999. During 2000-01, he was with Bell Laboratories, Lucent Technologies, Murray Hill, NJ, USA. Since 2002 he is with the Department of Electrical Engineering at IIT Bombay, and presently hold the position of full professor. His research interests are in the area of CMOS, flash memory devices, and device reliability. He has published more than 150 papers in peer reviewed journals and conferences, delivered invited talks in major international conferences around the world including IEEE IEDM and IEEE IRPS, and has acted as reviewers and chairs of many IEEE journals and conferences. He collaborates actively with many major semiconductor industries, is a fellow of the Indian National Academy of Engineering (INAE), fellow of the Institute of Electrical and Electronics Engineers (IEEE, for contributions to CMOS transistor gate stack reliability) and a distinguished lecturer of the IEEE Electron Devices Society (EDS).