This lecture will cover the basics of CMOS image sensor processes, noise characteristics of CMOS Image sensors, including thermal noise, flicker noise, reset noise and Vth variations of readout source follower, and signal chain from pixel to column parallel ADCs to achieve low noise readout as low as 1e-. This lecture will also cover some of dynamic range extension techniques, including multiple exposure techniques, logarithmic compression techniques and frequency conversion techniques, and low power techniques.
Makoto Ikeda received the BE, ME, and Ph.D. degrees in electrical engineering from the University of Tokyo, Tokyo, Japan, in 1991, 1993 and 1996, respectively. He joined the University of Tokyo as a research associate, in 1996, and now professor at the department of electrical engineering and information systems. At the same time he has been involving the activities of VDEC(VLSI Design and Education Center, the University of Tokyo), to promote VLSI design educations and researches in Japanese academia. He worked for asynchronous circuits design, smart image sensor for 3-D range finding, and time-domain circuits for associate memories. He has published more than 230 technical publications, including 10 invited papers, and 7 books/chapters. He has been serving various positions of various international conferences, including ISSCC IMMD sub-committee chair (ISSCC 2015 - ), A-SSCC 2015 TPC Chair, VLSI Circuits Symposium PC Chair for 2016/2017. He is a member of IEEE, IEICE Japan, IPSJ and ACM.