Nowadays, future critical systems are designed in advanced CMOS nodes where reliability challenges are now an important detractor. This talk will review the reliability challenges that are lying in front of us and will introduce various techniques how to propagate reliability simulations in various design parts as well as new innovative compensation techniques.
Vincent Huard received the B.S. (1996) in physics and the M.S. (1997) in electrical engineering from INPG. He received his Ph.D. (2000) in physics from Grenoble university. In 2000, he was Visiting Scholar at UCSB. In 2002, he joined Philips Semiconductors. Since 2007, he is at STMicroelectronics as Design to Product Reliability manager and a Distinguished Member of Technical Staff. His research interests cover design for reliability and modeling, and new solutions for products qualification and hardening. He authored 140+ papers, several invited papers and tutorials, held 15 patents and is serving as IRPS Management Committee member. He is the recipient of the IRPS 2012, 2013 and 2016 Outstanding Paper awards and DATE 2015 Best Paper award.