The rapid growth of the photovoltaic (PV) industries and deployments globally have arisen reliability and durability issues over time. Among all the various reliability issues Potential-induced degradation (PID) is an exceptionally severe PV durability issue owing to its rapid degradation. PID accelerated tests have been performed on c-Si, CIGS and perovskite solar cells to investigate the reduction in electrical performance. The rapid reduction in electrical performance after PID is correlated to the microstructural and chemical properties of the constituent materials. Further, microstructural defects have been explored using various electrical and material characterization techniques such as FESEM, XPS, APT, XRD, PL, Raman spectroscopy, Impedance spectroscopy and Mott-Schottky analysis. A better understanding of PID failures with respect to material properties have been explored in detail by destructive failure analysis.
Zeel Purohit is a joint Ph.D. student of University Hasselt, Belgium and Pandit Deendayal Petroleum University (PDPU), Gujarat, India. She has been working in IMEC at the campus of Engeryville 2, Thor Park, Belgium. Her PhD thesis entitled as ‘Performance evaluation of c-Si, CIGS and perovskite solar cells under Potential Induced Degradation (PID)’. Her research focus is reliability and durability of photovoltaics. Another aspects of study is to investigation of failure mechanism of PV panels. Her PhD research is a result of building bridge between India and Belgium and focused on exploring material and electrical characterizations of degraded solar cells.