{"version":"1.0","provider_name":"EE IIT Bombay","provider_url":"https:\/\/www.ee.iitb.ac.in\/web","author_name":"master_admin","author_url":"https:\/\/www.ee.iitb.ac.in\/web\/author\/master_admin\/","title":"Neutron Radiation Effects on MOS Devices &ndash; EE IIT Bombay","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"O2HHSkwz4m\"><a href=\"https:\/\/www.ee.iitb.ac.in\/web\/past_projects\/neutron-radiation-effects-on-mos-devices\/\">Neutron Radiation Effects on MOS Devices<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.ee.iitb.ac.in\/web\/past_projects\/neutron-radiation-effects-on-mos-devices\/embed\/#?secret=O2HHSkwz4m\" width=\"600\" height=\"338\" title=\"&#8220;Neutron Radiation Effects on MOS Devices&#8221; &#8212; EE IIT Bombay\" data-secret=\"O2HHSkwz4m\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script>\n\/*! This file is auto-generated *\/\n!function(c,d){\"use strict\";var e=!1,o=!1;if(d.querySelector)if(c.addEventListener)e=!0;if(c.wp=c.wp||{},c.wp.receiveEmbedMessage);else if(c.wp.receiveEmbedMessage=function(e){var t=e.data;if(!t);else if(!(t.secret||t.message||t.value));else if(\/[^a-zA-Z0-9]\/.test(t.secret));else{for(var r,s,a,i=d.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),n=d.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),o=new RegExp(\"^https?:$\",\"i\"),l=0;l<n.length;l++)n[l].style.display=\"none\";for(l=0;l<i.length;l++)if(r=i[l],e.source!==r.contentWindow);else{if(r.removeAttribute(\"style\"),\"height\"===t.message){if(1e3<(s=parseInt(t.value,10)))s=1e3;else if(~~s<200)s=200;r.height=s}if(\"link\"===t.message)if(s=d.createElement(\"a\"),a=d.createElement(\"a\"),s.href=r.getAttribute(\"src\"),a.href=t.value,!o.test(a.protocol));else if(a.host===s.host)if(d.activeElement===r)c.top.location.href=t.value}}},e)c.addEventListener(\"message\",c.wp.receiveEmbedMessage,!1),d.addEventListener(\"DOMContentLoaded\",t,!1),c.addEventListener(\"load\",t,!1);function t(){if(o);else{o=!0;for(var e,t,r,s=-1!==navigator.appVersion.indexOf(\"MSIE 10\"),a=!!navigator.userAgent.match(\/Trident.*rv:11\\.\/),i=d.querySelectorAll(\"iframe.wp-embedded-content\"),n=0;n<i.length;n++){if(!(r=(t=i[n]).getAttribute(\"data-secret\")))r=Math.random().toString(36).substr(2,10),t.src+=\"#?secret=\"+r,t.setAttribute(\"data-secret\",r);if(s||a)(e=t.cloneNode(!0)).removeAttribute(\"security\"),t.parentNode.replaceChild(e,t);t.contentWindow.postMessage({message:\"ready\",secret:r},\"*\")}}}}(window,document);\n<\/script>\n","description":"Project Detail:\u00a0Neutron Radiation Effects on MOS Devices: Sponsored by B.R.N.S. (DAE) for outlay of 19.5 Lakhs.for period of three years Starting from 1997.Prof. D.K. Sharma is Principal Investigator and myself along with Prof. J.Vasi, Prof RLal were Investigators."}