{"id":3994,"date":"2022-01-20T09:54:12","date_gmt":"2022-01-20T09:54:12","guid":{"rendered":"https:\/\/www.ee.iitb.ac.in\/web?post_type=course_lists&#038;p=3994"},"modified":"2022-02-11T10:02:28","modified_gmt":"2022-02-11T10:02:28","slug":"ee-765-reliability-and-failure-analysis-of-electronic-devices","status":"publish","type":"course_lists","link":"https:\/\/www.ee.iitb.ac.in\/web\/course_lists\/ee-765-reliability-and-failure-analysis-of-electronic-devices\/","title":{"rendered":"EE 765 &#8211; Reliability and Failure Analysis of Electronic Devices"},"content":{"rendered":"\n<ol><li>Background and Introduction: Definitions of reliability, failure modes, mechanisms, cost of warranty returns, motivation for improving product reliability in the era of \u2018Planned Obsolescence\u2019.<\/li><li>Introduction to mathematical methods for reliability: Failure rates, Normal distribution function, Six Sigma, Exponential, Weibull and Lognormal distributions for reliability modeling. Manufacturing yields.<\/li><li>Accelerated testing: Types of accelerated tests, Designing accelerated tests for typical stressors experienced in field, Acceleration factors, Arrhenius, Eyring and modified Coffin-Manson models.<\/li><li>Introduction to semiconductor device packaging: Materials and processes used for semiconductor device packaging, stresses induced because of packaging.<\/li><li>Physics of failure &#8211; based models for: Mass transport-induced failures (electromiration and stress voiding), Electronic charge-induced failures (Dielectric breakdown, Hot carrier effects, Electrical over-stress and Electrostatic discharge), Environmental damage (moisture ingress, corrosion, radiation damage), Degradation of interconnects (solder creep and fatigue).<\/li><li>Failure Analysis techniques: Non-destructive techniques \u2013 I-V trace, Infrared, X-ray and Electroluminescence imagining, Destructive techniques- chemical \/ thermal \/ mechanical decapsulation of electronic devices for die-level failure analysis, materials analysis techniques \u2013 FTIR, EDX.<\/li><li>Special topics: Design for reliability, degradation in photovoltaic (PV) modules, systems reliability.<\/li><\/ol>\n","protected":false},"featured_media":0,"parent":0,"template":"","meta":{"site-sidebar-layout":"default","site-content-layout":"default","ast-global-header-display":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":""},"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v19.8 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>EE 765 - Reliability and Failure Analysis of Electronic Devices &ndash; EE IIT Bombay<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.ee.iitb.ac.in\/web\/course_lists\/ee-765-reliability-and-failure-analysis-of-electronic-devices\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"EE 765 - Reliability and Failure Analysis of Electronic Devices &ndash; EE IIT Bombay\" \/>\n<meta property=\"og:description\" content=\"Background and Introduction: Definitions of reliability, failure modes, mechanisms, cost of warranty returns, motivation for improving product reliability in the era of \u2018Planned Obsolescence\u2019. Introduction to mathematical methods for reliability: Failure rates, Normal distribution function, Six Sigma, Exponential, Weibull and Lognormal distributions for reliability modeling. Manufacturing yields. 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