Souvik Mahapatra received his M.Sc. in Physics from Jadavpur University, Calcutta, India and Ph.D. in Electrical Engineering (Microelectronics) from Indian Institute of Technology, Bombay (IITB), India in 1995 and 1999 respectively. In 1999 he was at the University of Federal Armed Forces (UBw), Munich Germany. From 2000 to 2001 he was at Bell Laboratories, Lucent Technologies, Murray Hill, NJ, USA. From January 2002 he is with the Department of Electrical Engineering, IITB, where he is presently an Assistant Professor.

His doctoral thesis was on the study of hot-carrier degradation in conventional, channel engineered and high-k MOSFETs using a novel charge pumping technique. At Ubw, he worked on sub-bangap impact ionization in MOSFETs. At Bell Labs, he played a key role in designing and developing the unit cell of world’s first commercial CHISEL flash memory. His other research activities at Bell Labs were interface characterization of GaAs-GdO FETs and study of MOSFET bias temperature instability. His present research interest involves semiconductor device physics, simulation, modeling and characterization, novel devices, hot-carrier and bias temperature reliability issues in MOSFETs, flash memories and high-k gate dielectrics.

He has published more than 30 papers in refereed international journals and conferences, got the best Ph.D. thesis award from Indian National Academy of Engineers in 2001 and worked as a reviewer for many international journals and conferences

Email:souvik@ee.iitb.ac.in

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