IEEE International Workshop on Reliability Aware System Design and Test

(In conjunction with the International Conference on VLSI Design)

Bangalore, India January 7-8, 2010


Keynote Speaker


Dr. Yervant Zorian




Dr. Yervant Zorian is the Vice President and Chief Scientist of Virage Logic Corp.
Previously, he was a Distinguished Member of Technical Staff at AT&T Bell Laboratories, Princeton, New Jersey. He is currently the President of the IEEE Test Technology Technical Council, and serves as the Editor-in-Chief Emeritus of the Journal on Design & Test of Computers. He received an MS degree in Computer Engineering from USC, a PhD in Electrical Engineering from McGill University, and an MBA from Wharton School of Business, University of Pennsylvania.

Dr. Zorian has authored more than 300 scientific papers, four books, holds over 20 US patents, and received numerous best scientific paper awards. A Fellow of the IEEE, he was selected by Electornic Engineering Times among the top 13 influencers on the semiconductor industry in the past fifty years. Dr. Zorian was the 2005 recipient of the prestigious Industrial Pioneer Award, and the 2006 recipient of the IEEE Hans Karlsson Award.



Banquet Speaker


Dr. Gregory Taylor


Dr. Gregory F. Taylor

Dr. Gregory F. Taylor is an Intel Fellow and director of the Circuit Research Lab in Intel Labs. He is responsible for research on low power and high speed circuits, high speed signaling, and enabling design and circuit technologies within Intel.

Taylor joined Intel in 1991 and has held several senior design engineering positions working on 10 generations of microprocessors including members of Intel's Pentium®, Pentium® II, Pentium® III, and Intel NetBurst® microarchitecture families. Prior to joining Intel, he worked as a principal engineer at Bipolar Integrated Technology.

Taylor is a Fellow of the Institute of Electrical and Electronics Engineers. He received his bachelor's degree in computer and systems engineering in 1981 from Rensselaer Polytechnic Institute (RPI). He also received a master's degree and doctorate in computer and systems engineering from RPI in 1983 and 1985, respectively. His graduate work was completed with the support of a Fellowship from the Fannie and John Hertz Foundation.



Invited Speaker


Prof. Mark Zwolinski







Prof. Mark Zwolinski is a Professor at Southampton University, UK. His main research interests are circuit and mixed-signal simulation and testing of mixed-signal circuits and systems. He is the author of Digital Design with VHDL.  He has also co-author of a book on Circuit Simulation.

Invited Speaker


Prof. Bernd Becker





Prof. Bernd Becker is a Professor at Freiburg University, Germany.

The research activities of Bernd Becker have been primarily in the area of computer-aided design, test and verification of (digital) circuits and systems (VLSI CAD). A focus of his research is the development and analysis of efficient data structures and algorithms in VLSI CAD. The development of symbolic methods for test and verification of digital circuits and their integration in the industrial flow is one of the major achievements of his work. More recently, he has been working on verification methods for embedded systems and test techniques for nanoelectronic circuitry. He has published more than 150 papers in peer-reviewed conferences and journals. He has been the holder of several research grants from DFG, BMBF and industry as well.



Panel Participant


Prof. Sandip Kundu





Prof. Sandip Kundu is a Professor in Electrical and Computer Engineering Department. He joined University of Massachusetts in January of 2005. Prior to joining UMass, he was with Intel Corporation between 1997 and 2005 and IBM Research Centers (T J Watson & ARL) between 1988 and 1997.


He obtained Ph.D in Electrical & Computer Engineering from University of Iowa (1988) and B.Tech (Hons.) in Electronics & Electrical Communication Engineering from Indian Institute of Technology, Kharagpur (1984).His research experience includes VLSI Circuit Design, VLSI Testing, CAD algorithms, Microarchitecture and Information and Coding Theory. He has scholarly publications in all of those areas.He has won numerous awards including two best paper awards, Development Leadership Pioneer Award at Intel Corporation and Outstanding Technical Achievement award at IBM Corporation. He was also a recipient of National Talent Scholarship in India. He is a fellow of the IEEE, current Distinguished Visitor of the IEEE Computer Society and an Associate Editor of the IEEE Transactions on VLSI Systems. Previously, he served as an Associate Editor of the IEEE Transactions on Computers.


Panel Participant


Prof. Souvik Mahapatra









Prof. Souvik Mahapatra is a Professor at Indian Institute of Technology, Mumbai. His research interest includes NBTI and hot carrier degradation of MOSFETs, CMOS reliability, high k dielectric.

Panel Participant


Prof. Mehdi Tahoori







Prof. Mehdi Tahoori is an Associate professor at Northeastern University, USA. His research interest includes test, reliability, and design automation of digital systems.



Panel Participant


Prof. Michael Glass