IEEE International Workshop on Reliability Aware System Design and Test 2015

Technical Program

January 8, 2015 – Thursday

10:00 am – 10:45 am	Keynote Address – I Speaker: Somyendu Raha, IISc Title: Statistical Timing Driven Routing in VLSI Circuits
10:45 am – 11:30 am	Keynote Talk – II Speaker: Aditya Kanade, IISc Title: Reliable Software Development
11:30 am – 11:45 am	COFFEE
11:45 am – 12:15 pm	Invited Talk - I Speaker: Dipti Deodhare, CARE, DRDO Topic: Reliability Requirements in Defense
12:15 pm – 1:00 pm	Invited Talk – II Speaker: Prahalad, Math Works Topic: Reliable RTOS
1:00 pm – 2:00 pm	LUNCH
2:00 pm – 2:30 pm	Invited Talk – III Speaker: Susanta Chakrabarty, BESU
2:30 pm – 3:15 pm	Technical Session -1 VLSI Testing
3:15 pm – 3:30 pm	COFFEE
3:30 pm – 4:15 pm	Technical Session - 2
4:15 pm – 4:20 pm	Closing