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Keynote Speaker
Dr. Yervant Zorian
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Dr. Yervant Zorian is the Vice President and Chief
Scientist of Virage Logic Corp.
Previously, he was a Distinguished Member of Technical Staff at AT&T
Bell Laboratories, Princeton, New Jersey. He is currently the President
of the IEEE Test Technology Technical Council, and serves as the
Editor-in-Chief Emeritus of the Journal on Design & Test of
Computers. He received an MS degree in Computer Engineering from USC, a
PhD in Electrical Engineering from McGill University, and an MBA from
Wharton School of Business, University of Pennsylvania.
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Dr. Zorian
has authored more than 300 scientific papers, four books, holds over 20 US
patents, and received numerous best scientific paper awards. A Fellow of
the IEEE, he was selected by Electornic Engineering Times among the top 13
influencers on the semiconductor industry in the past fifty years. Dr.
Zorian was the 2005 recipient of the prestigious Industrial Pioneer Award,
and the 2006 recipient of the IEEE Hans Karlsson Award.
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Banquet Speaker
Dr. Gregory Taylor
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Dr. Gregory F. Taylor is an Intel Fellow and director of the
Circuit Research Lab in Intel Labs. He is responsible for research on low
power and high speed circuits, high speed signaling, and enabling design
and circuit technologies within Intel.
Taylor
joined Intel in 1991 and has held several senior design engineering
positions working on 10 generations of microprocessors including members
of Intel's Pentium®, Pentium® II, Pentium® III, and Intel NetBurst®
microarchitecture families. Prior to joining Intel, he worked as a
principal engineer at Bipolar Integrated Technology.
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Taylor is a
Fellow of the Institute of Electrical and Electronics Engineers. He
received his bachelor's degree in computer and systems engineering in 1981
from Rensselaer Polytechnic Institute (RPI). He also received a master's
degree and doctorate in computer and systems engineering from RPI in 1983
and 1985, respectively. His graduate work was completed with the support of
a Fellowship from the Fannie and John Hertz Foundation.
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Invited Speaker
Prof. Mark Zwolinski
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Prof.
Mark Zwolinski is a Professor
at Southampton University, UK. His main research interests are circuit and
mixed-signal simulation and testing of mixed-signal circuits and systems.
He is the author of Digital
Design with VHDL. He has also
co-author of a book on Circuit Simulation.
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Invited Speaker
Prof. Bernd Becker
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Prof. Bernd Becker
is a Professor at Freiburg
University, Germany.
The research activities
of Bernd Becker have been primarily in the area of computer-aided design,
test and verification of (digital) circuits and systems (VLSI CAD). A focus
of his research is the development and analysis of efficient data
structures and algorithms in VLSI CAD. The development of symbolic methods
for test and verification of digital circuits and their integration in the
industrial flow is one of the major achievements of his work. More
recently, he has been working on verification methods for embedded systems
and test techniques for nanoelectronic circuitry. He has published more
than 150 papers in peer-reviewed conferences and journals. He has been the
holder of several research grants from DFG, BMBF and industry as well.
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Panel Participant
Prof. Sandip Kundu
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Prof. Sandip Kundu is a Professor in Electrical and Computer
Engineering Department. He joined University of Massachusetts in January of
2005. Prior to joining UMass, he was with Intel Corporation between 1997
and 2005 and IBM Research Centers (T J Watson & ARL) between 1988 and
1997.
He obtained
Ph.D in Electrical & Computer Engineering from University of Iowa
(1988) and B.Tech (Hons.) in Electronics & Electrical Communication
Engineering from Indian Institute of Technology, Kharagpur (1984).His
research experience includes VLSI Circuit Design, VLSI Testing, CAD
algorithms, Microarchitecture and Information and Coding Theory. He has
scholarly publications in all of those areas.He has won numerous awards
including two best paper awards, Development Leadership Pioneer Award at
Intel Corporation and Outstanding Technical Achievement award at IBM
Corporation. He was also a recipient of National Talent Scholarship in
India. He is a fellow of the IEEE, current Distinguished Visitor of the
IEEE Computer Society and an Associate Editor of the IEEE Transactions on
VLSI Systems. Previously, he served as an Associate Editor of the IEEE
Transactions on Computers.
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Panel Participant
Prof. Souvik Mahapatra
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Prof. Souvik Mahapatra is a Professor at Indian Institute of Technology,
Mumbai. His research interest includes NBTI and hot carrier degradation of
MOSFETs, CMOS reliability, high k dielectric.
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Panel Participant
Prof. Mehdi Tahoori
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Prof.
Mehdi Tahoori is an Associate
professor at Northeastern University, USA. His research interest includes test, reliability, and design automation
of digital systems.
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Panel Participant
Prof. Michael Glass
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