4^th IEEE International Workshop on Reliability Aware System Design and Test

(In conjunction with the International Conference on VLSI Design)

Pune, India January 9-10, 2013

Organizing Committee General Co-Chairs Adit Singh (Auburn Univ., USA) Virendra Singh (IITB, India) General Vice Co-Chairs Michiko Inoue (NAIST, Japan) Sreejit Chakravarty (LSI, USA) Program Co-Chairs Erik Larsson (Lund Univ., Sweden) Rubin Parekhji (Texas Instruments, India) Program Vice Co-Chairs Ilia Polian (Passau Univ., Germany) MS Gaur (MNIT, India) Organizing Committee Co-Chairs Bhargab Bhattacharya (ISI, India) V Kamakoti (IITM, India) Publication Chair Vijay Laxmi (MNIT, India) Finance Chair Pradip Thaker (Maxim, India) S. Ramakrishnan (WT, India) Publicity Chair: Susanta Chakravarty (BESU, India) Local Arrangement chair TBD Website management chair Sushil Kabra (BSNL, India) Registration Chair Jaynarayan Tudu (IISc, India)

Steering Committee: Chair Kewal K. Saluja (Univ. of Wisconsin-Madison, USA) Members Jacob A. Abraham (University of Texas, Austin, USA) Vishwani D. Agrawal (Auburn University, US) Bashir Al-Hashimi (Suthampton Univ., UK) Bernd Becker (Freiburg University, Germany) Abhijit Chatterjee (Georgia Tech, USA) Hideo Fujiwara (NAIST, Japan) Masahiro Fujita (Tokyo Univ., Japan) Erik Larsson (Lund Univ., Sweden) Rubin Parekhji (Texas Instruments, India) Sudhakar M. Reddy (Iowa Univ., USA) Adit D. Singh (Auburn Univ., USA) Virendra Singh (IITB, India)

Program Committee M. Azimane, NXP Semiconductors, The Netherlands B. Bhattacharya, ISI, India P. Bernardi, Politecnico di Torino, Italy K. Chakrabarty, Duke University, USA K.T. Cheng, University of California, Santa Barbara, USA G. Di Natale, LIRMM, France E. Fernandes Cota, Universidade Federal do Rio Grande do Sul, Brasil P. Harrod, ARM, United Kingdom U. Ingelsson, Linkoping University, Sweden G. Jervan, Tallinn University of Technnology, Estonia P. Girard, LIRMM, France S. K. Goel, USA V. Hahanov, Kharkov National University of Radioelectronics, Ukraine K. Hatayama, Semiconductor Technology Academic Research Center, Japan S. Hellebrand, Universitat Paderborn, Germany T. Inoue, Hiroshima City University, Japan V. Kamakoti, IIT Madras, India S. Kajihara, Kyushu Institute of Technology, Japan R. Kapur, Synopsys, USA H. Ko,McMaster University, Canada S. Kundu,University of Massachusetts Amherst,USA S. Kumar, University of Jonkoping, Sweden V. Laxmi (Malaviya National Institute of Technology, India) Y. Makris, Yale University, USA A. Matrosova, Tomsk State Univ., Russia S. Mitra, Standford University, USA C. Metra, University of Bologna, Italy Z. Navabi, Tehran University, Iran N. Nicolici, McMaster University, Canada C.Y. Ooi, Malaysia Technology University, Malaysia A. Osseiran, Edith Cowan University, Australia S. Othake, Nara Institute of Science and Technology, Japan J. Raik, Tallinn University of Technnology, Estonia S. Ravi, Texas Instruments, India M. Renovell, LIRMM, France B. Rouzeyre, LIRMM, France M. Sonza Reorda, Politecnico di Torino, Italy N. Tamrapalli, AMD, India P. Thaker, Analog Devices, India P. Varma, Bluepearlsoftware, USA V. Vedula, Intel, India B. Vermeulen, NXP Semiconductors, The Netherlands M. Violante, Politecnico di Torino, Italy H.-J. Wunderlich, Universitat Stuttgart, Germany Q. Xu, The Chinese University of Hong Kong, China T. Yoneda, Nara Institute of Science and Technology, Japan Z. You, Hunan University, China M. Zwolinki, University of Southampton, United Kingdom