About Us

Nano-electronic device characterization lab, is a premier device characterization lab, setup at Indian Institute of Technology, Bombay, with financial support from the Department of Information Technology (DIT), the Ministry of Communication and Information Technology (MCIT), Government of India.Its located in the 3rd floor of new Annex building in the Electrical Engineering Department.

The lab has capability of conducting measurements on wafers as well as some packaged devices of manageable dimensions. The lab is equipped with several probe stations, some of which have variable temperature settings (thermo chuck from room temperature upto 200C). In general the four terminal IVs, CVs, stress measurements, and memory (Read-Write-Endurance), low frequency noise characterization can be done. In addition to the lab also has the flexibility to design various measurements according to the need of the user. The details of each set-up & all the instruments are given in the specific sections of the webpage.