2nd IEEE International Workshop on
Reliability Aware System Design and Test (In
conjunction with the International
Conference on VLSI Design) |
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Past Event Key Dates Next |
Even as advances in CMOS technology come up against
physical limits of material properties and lithography, raising many new
challenges that must be overcome to ensure IC quality and reliability, there
appears to be no obvious alternate technology that can replace End-of-Roadmap
CMOS over the next decade. However, many reliability challenges from
increasing defect rates, manufacturing variations, soft errors, wearout, etc. will need to be addressed by innovative new
design and test methodologies if device scaling is to continue on track as
per Moore`s Law to 10nm and beyond. The key objective of
this annual workshop, planned to be held in conjunction with the
International Conference on VLSI Design, is to provide an informal forum for
vigorous creative discussion and debate of this area. The aim is to encourage
the presentation and discussion of truly innovative and `out-of-the-box` ideas that may not yet have been
fully developed for presentation at reviewed conferences to address these
challenges. Additionally, the workshop invites embedded talks and tutorials
on cutting edge topics related to reliability aware design of CMOS and hybrid
nanotechnology systems. Representative topics include, but are not limited to:
Submissions Authors
are invited to submit previously unpublished technical proposals. The proposals
must be full papers not to exceed 6 pages. Each submission should include:
title, full name and affiliation of all authors, a short abstract of 50
words, and 4 to 6 keywords. Also, identify a contact author and include
a complete correspondence address, phone number, fax number, and e-mail
address. Submit a copy of your proposal in PDF either online
submission through EasyChair
or via e-mail to : rasdat2011@easychair.org,
rasdat2011@serc.iisc.ernet.in Key Dates: Paper
Submission: October 15, 2010 (EXTENDED) Acceptance
Notification: November
18, 2010 Final
Paper Due: December 15, 2010 Presentation
Due: Jan 1, 2011 Keynote Speakers John Carulli ( Michel Renovell (LIRMM, France) Invited Speakers Arun Somani (Iowa State University, USA) Sanjit Seshia (Univ. of California, Berkley, USA) Jacob Abraham (Univ. of Texas, Austin, USA) Masahiro Fujita (Tokyo Univ., Japan) Michiko Inoue (NAIST, Japan) Rajat Moona (IIT Kan[ur,
India] M. Ravindra (ISRO,
India) General Information
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Organizing Committee General Co-Chairs Adit
Singh ( Virendra Singh ( General Vice Co-Chairs Michiko
Inoue (NAIST, JP) Sreejit Chakravarty ( Program Co-Chairs Erik
Larsson ( Rubin
Parekhji (TI, IN) Program Vice
Co-Chairs Ilia Polian ( MS Gaur (MNIT, IN) Organizing Committee Co-Chairs Bhargab
Bhattacharya (ISI, IN) V. Kamakoti (IITM, IN) Publication Chair Vijay Laxmi
(MNIT, IN) Finance Co-Chairs Pradip Thaker ( S. Ramakrishnan
(WT, IN) Publicity Chair Susanta Chakravarty (BESU, IN) Local Arrangement chair Shankar Balachandran
(IITM, IN) Website management chair Sushil Kabra
(BSNL, IN) Registration Chair Jaynarayan Tudu ( Steering
Committee K.K. Saluja (US) - Chair J.A. Abraham (US) V.D. Agrawal (US) B. Al-Hashimi ( B. Becker (DE) A. Chatterjee (US) H. Fujiwara (JP) M. Fujita (JP) E. Larsson (SE) R. Parekhji
(IN) S.M.
Reddy (US) A.D. Singh (US) V. Singh (IN) Program
Committee M. Azimane
(NL) P. Bernardi
(IT) B. Bhattacharya (IN) K. Chakrabarty
(US) S. Chakravarty
(IN) T. Cheng (US) E.F. Cota
(BR) D. Das (IN) G. Di Natale
(FR) P. Girard (FR) S.K. Goel
(US) P. Harrod
( K. Hatayama (JP) V. Hahanov
(UA) S.
Hellebrand (DE) U. Ingelsson (SE) M. Inoue (JP) T. Inoue (JP) G. Jervan
(ES) S.
Kajihara (JP) V.
Kamakoti (IN) R. Kapur
(US) H. Ko
(CA) S. Kumar
(SE) S. Kundu
(US) V. Laxmi
(IN) Y. Makris (US) A. Matrosova (RU) C. Metra (IT) S. Mitra
(US) S.K. Nandy
(IN) Z. Navabi
(IR) N. Nicolici
(CA) S. Ohtake
(JP) C.Y. Ooi
(MY) A. Osseiran (AU) J. Raik (EE) S. Ravi
(IN) CP
Ravikumar (IN) M. Renovel
(FR) B.
Rouzeyre (FR) M. Sonza
Reorda (IT) N.
Tamrapalli (IN) P. Thaker
(IN) P. Varma (US) V. Vedula
(IN) B.
Vermeulen (NL) M.
Violante (IT) H. -J.
Wunderlich (DE) Q. Xu (CN) T. Yoneda
(JP) Z. You (CN) M. Zwolinski (UK) |