- Basics of MOSFET operation (Mechanisms for Drain, Substrate and Gate current)
- Conventional and non-conventional MOSFET scaling – innovations in materials for gate stack, channel and junctions, and architecture, processes for FinFETs and Gate All Around Nanosheet FETs
- Introduction to Flash memory NOR/NAND architecture, Floating Gate/Charge Trap, Mirror Bit
- Basics of Flash memory operation: Program, Erase, Program/Read Disturbs, Retention
- Innovations in Flash Memory scaling, 2D and 3D NAND, Floating Gate and Charge Trap Flash
- Reliability of logic and memory devices (theory, measurements and modeling) – BTI, HCD, TDDB in logic, P/E cycling, Data retention, Disturbs in memory
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