Scope of testing and verification in the VLSI design process. Issues in test and verification of complex chips, embedded cores and SOCs; Fundamentals of VLSI testing. Fault models. Automatic test pattern generation. Design for testability. Scan design. Test interface and boundary-scan. System testing and test for SOCs. IDDQ testing. Delay fault testing. BIST for testing of logic and memories. Test automation; Design verification techniques based on simulation, analytical and formal approaches. Functional verification. Timing verification. Formal verification. Basics of equivalence checking and model checking. Hardware emulation.